Wireless functional testing of RFID tag

• US 20060206277A1
• Filed: 02/28/2005
• Published: 09/14/2006
• Est. Priority Date: 02/28/2005
• Status: Active Grant

• Current Assignee: Impinj, Inc.
• Original Assignee: Impinj, Inc.
• Inventors: Horch, Andrew E.
• Granted Patent: US 7,400,255 B2
• Time in Patent Office: Days
• US Class Current: 702/82
• CPC Class Codes: B07C 5/344 according to electric or electromagnetic properties sorting according to size measured electrically or electronically B07C5/08; material testing by magnetic means G01N24/00, G01N27/00, by electrical means G01N27/00; electrical measuring devices in general G01R; coin testing G07D5/00
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: H01L 2223/6677 for antenna, e.g. antenna included within housing of semiconductor device antennas per se H01Q
• CPC Class Codes: Y10T 29/49004 including measuring or testing of device or component part

Abstract

Wirelessly testing an RFID tag before it is packaged or otherwise entered into a process reserved for “working” RFID tags is described. Various processes that employ such wireless testing as well as various “on-die” RFID tag antennae designs for facilitating the wireless testing are also described.

Claims

1. A method, comprising:

transmitting a wireless signal to an RFID tag, while said RFID tag'"'"'s positioning is under the control of a machine that transports said RFID tag, to administer a functional test to said RFID tag, said RFID tag having an on-die antenna adapted to receive said wireless signal.

2. The method of claim 1 further comprising:

obtaining one of a plurality of possible results of said functional test;

selecting a distinct location from amongst a plurality of distinct locations, said distinct location corresponding to said obtained result;

placing said RFID tag in said distinct location.

3. The method of claim 2 wherein said distinct location is where scrap RFID tags are placed, said RFID tag deemed to have failed said functional test.

4. The method of claim 2 wherein said distinct location is where RFID tags to be packaged are placed, said RFID tag deemed to have passed said functional test.

5. The method of claim 4 further comprising packaging said RFID tag after said placing.

6. The method of claim 4 further comprising:

transmitting a second wireless signal to a second RFID tag, while said second RFID tag is in the grasp of said machine, to administer a second functional test to said second RFID tag, said second RFID tag having an on-die antenna adapted to receive said second wireless signal;

determining that second RFID tag has failed said second functional test; and

,

placing said second RFID tag in a second distinct location, said second distinct location where scrap RFID tags are placed.

7. The method of claim 2 wherein said distinct location is where RFID tags to be used are placed, said RFID tag deemed to have passed said functional test.

8. The method of claim 2 wherein said distinct location is a starting location for a packing process that packages said RFID tag, said RFID tag deemed to have passed said functional test.

9. The method of claim 2 wherein said distinct location is where RFID tags that are deemed marginally acceptable are placed, said RFID tag deemed to have marginally passed said functional test.

10. The method of claim 1 wherein said machine is a pick-and-place machine.

11. The method of claim 10 wherein said transmitting a wireless signal further comprises transmitting a wireless signal from an antenna that is attached to said pick-and-place machine.

12. The method of claim 10 wherein other RFID tags yet to be picked and that were manufactured from a same wafer that said RFID tag was manufactured from are not functionally tested with said wireless signal, said RFID tag being closer than said other RFID tags to said antenna.

13. The method of claim 1 wherein other RFID tags yet to be picked and that were manufactured from a same wafer that said RFID tag was manufactured from are not functionally tested with said wireless signal, said RFID tag being closer than said other RFID tags to an antenna that transmits said wireless signal during said administering of said functional test.

14. The method of claim 1 wherein said RFID tag on-die antenna is electrically isolated from said RFID tag'"'"'s die seal ring.

15. The method of claim 1 wherein said RFID tag on-die antenna is electrically integrated with a stacked metallic structure, said stacked metallic structure to thwart penetration of contaminates into said RFID tag'"'"'s active device area.

16. The method of claim 15 wherein said stacked metallic structure comprises a wire, a bar contact and a bar via.

17. An apparatus, comprising:

a pick-and-place machine to pick an RFID tag and place said RFID tag at a location, said RFID tag having an on-die antenna; and

,

an RFID tag functional tester having an antenna, said antenna to transmit a wireless signal used to functionally test said RFID tag while said RFID tag is in the grasp of said pick-and-place machine.

18. The apparatus of claim 17 wherein said pick-and-place machine places said RFID tag at said location via a trajectory, said RFID tag functional tester being situated independently of said pick-and-place machine and having said antenna situated so as to test said RFID tag while said RFID tag passes a point along said trajectory.

19. The apparatus of claim 17 wherein said antenna is attached to said pick-and-place machine.

20. The apparatus of claim 17 wherein said RFID tag on-die antenna is electrically isolated from said RFID tag'"'"'s die seal ring.

21. The apparatus of claim 17 wherein said RFID tag on-die antenna is electrically integrated with a stacked metallic structure, said stacked metallic structure to thwart penetration of contaminates into said RFID tag'"'"'s active device area.

22. A method, comprising:

a) picking an RFID tag from amongst a plurality of RFID tags manufactured from a same wafer, said RFID tag having an on-die antenna;

b) transmitting a wireless signal to said RFID tag to administer a functional test to said RFID tag;

c) determining that said RFID tag passed said functional test; and

,

d) packaging said RFID tag.

23. The method of claim 22 wherein said transmitting a wireless signal further comprises transmitting a wireless signal from an antenna that is attached to a pick-and-place machine that performs said picking.

24. The method of claim 22 wherein other RFID tags yet to be picked from said sawed wafer are not functionally tested with said wireless signal, said RFID tag being closer than said other RFID tags to an antenna that transmits said wireless signal.

25. The method of claim 22 wherein said RFID tag on-die antenna is electrically isolated from said RFID tag'"'"'s die seal ring.

26. The method of claim 22 wherein said RFID tag on-die antenna is electrically integrated with a stacked metallic structure, said stacked metallic structure to thwart penetration of contaminates into said RFID tag'"'"'s active device area.

27. The method of claim 22 where said stacked metallic structure comprises a bar wire and a bar via.