RFID testing system

• US 20060208079A1
• Filed: 05/19/2005
• Published: 09/21/2006
• Est. Priority Date: 03/21/2005
• Status: Abandoned Application

• Current Assignee: Industrial Technology Research Institute
• Original Assignee: Industrial Technology Research Institute
• Inventors: Chang, Rita, Chen, Shih-Lin, Wang, Sheng-Pi, Chen, Pei-Chun, Chang, Wei, Yu, Chun-Te
• Application Number:
  US11/132,219
• Publication Number:
  US 20060208079A1
• Time in Patent Office: Days
• US Class Current: 235/451
• CPC Class Codes: G06K 7/0008 General problems related to the reading of electronic memory record carriers, independent of its reading method, e.g. power transfer

Abstract

The present invention discloses a RFID testing system, comprising an object-under-test having a RFID tag attached thereto, a RFID reader and a tester. Wherein, the tester further comprises: a base; a bar-shaped first rail, mounted on the base in a stationary manner; a bar-shaped second rail, perpendicularly and slidably mounted on the first rail for enabling the second rail to move linearly along the first rail; a bar-shaped third rail, slidably mounted on the second rail and disposed perpendicular to the first and the second rails for enabling the third rail to move linearly along the second rail; and a clamping device, slidably mounted on the third rail for enabling the clamping device to move linearly along the third rail.

Claims

1. A RFID testing system, comprising:

an object-under-test, having a RFID tag attached thereto;

a RFID reader; and

a tester, further comprising;

a base;

a bar-shaped first rail, mounted on the base in a stationary manner;

a bar-shaped second rail, perpendicularly and slidably mounted on the first rail for enabling the second rail to move linearly along the first rail;

a bar-shaped third rail, slidably mounted on the second rail and disposed perpendicular to the first and the second rails for enabling the third rail to move linearly along the second rail; and

a clamping device, slidably mounted on the third rail for enabling the clamping device to move linearly along the third rail.

2. The RFID testing system of claim 1, wherein a first driver is arranged at the intersection of the first rail and the second rail for driving the second rail to move linearly along the first rail.

3. The RFID testing system of claim 1, wherein a second driver is arranged at the intersection of the second rail and the third rail for driving the third rail to move linearly along the second rail

4. The RFID testing system of claim 1, wherein a third driver is arranged at the intersection of the third rail and the clamping device for driving the clamping device to move linearly along the third rail.

5. The RFID testing system of claim 1, wherein the clamping device is capable of fixedly clasp a device selected from the group consisting of the object-under-test and the RFID reader.

6. The RFID testing system of claim 1, further comprising a processing device and a controlling device electrically connected to the processing device and the tester.

7. The RFID testing system of claim 1, wherein the tester is operated manually.

8. The RFID testing system of claim 6, wherein the processing device further comprises a display unit.

9. The RFID testing system of claim 6, wherein the processing device further comprises a memory unit

10. The RFID testing system of claim 6, wherein the controlling device is capable of controlling the tester to drive the second rail, the third rail and the clamping device to move in a manner relative to each other.