×

System and method for testing a memory for a memory failure exhibited by a failing memory

  • US 20060218453A1
  • Filed: 05/11/2006
  • Published: 09/28/2006
  • Est. Priority Date: 10/29/2004
  • Status: Active Grant
First Claim
Patent Images

1. A method for testing a memory on automated test equipment (ATE) having a test vector memory, the method comprising:

  • sampling operating conditions for a memory exhibiting a memory failure, the sampling occurring over a period of time that includes the occurrence of the memory failure;

    creating a sequence of records representing the sampled operating conditions over the period of time;

    translating the sequence of records into a file of test vectors for execution by the ATE to simulate the sampled operating conditions under which the memory failure occurred;

    loading the file of test vectors into the test vector memory; and

    executing the file of test vectors on the ATE to test the memory according to the test vectors.

View all claims
  • 5 Assignments
Timeline View
Assignment View
    ×
    ×