Method, apparatus, and program for measuring an electromagnetic field and medium recording the program

• US 20060220635A1
• Filed: 01/20/2006
• Published: 10/05/2006
• Est. Priority Date: 01/20/2005
• Status: Active Grant

• Current Assignee: Taiyo Yuden Company Limited (Taiyo Yuden Co)
• Original Assignee: Taiyo Yuden Company Limited (Taiyo Yuden Co)
• Inventors: Tsutagaya, Hiroshi, Kazama, Satoshi, Sakurada, Masahiko
• Granted Patent: US 7,358,749 B2
• Time in Patent Office: Days
• US Class Current: 324/76.110
• CPC Class Codes: G01R 29/0871 Complete apparatus or systems; circuits, e.g. receivers or amplifiers G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857
• CPC Class Codes: G01R 31/002 where the device under test is an electronic circuit

Abstract

Provided is a method, apparatus and program for calculating an electric-field vector that allows for grasping the intensity, direction and phase of electric field on a scanning plane for an appliance, and a medium recording the program. An electric-field vector at an origin is calculated, based on potential-difference vectors in respective coordinate directions calculated depending upon a detected signal of at least a magnitude and phase of an electric-field component current by arranging a scanning electric-field sensor at an origin of a desired coordinate system established near an object-to-be-measured, signals detected at respective coordinates by sequential movement to desired coordinates on respective coordinate axes, and a detected reference signal of at least a magnitude and phase of a current by fixedly arranging a fixed magnetic-field sensor close to the object-to-be-measured, and distances between coordinates calculated based on the coordinates the scanning electric-field sensor is arranged and the origin.

Claims

1. A method of measuring an electric-field vector formed by an electromagnetic radiation source, the method comprising:

detecting a reference signal comprising at least one of electric-field and magnetic-field component currents by fixedly placing a first probe near the radiation source;

detecting a first signal comprising at least an electric-field component current at a first location, by moving a second probe to the first location near the radiation source;

detecting a second signal comprising at least an electric-field component current at a second location by moving the second probe to the second location;

calculating a potential difference between the first and second signals based on at least in part the first signal, the second signal, and the reference signal;

calculating a distance between the first and second locations; and

calculating an electric-field vector at the first location based on at least in part the potential difference and the distance.

2. The method of claim 1, further comprising calculating a distribution of electric-field vectors at multiple locations by sequentially moving the second probe to each location.

3. The method of claim 1, further comprising;

detecting a third signal comprising at least a magnetic-field component current at a third location by moving a third probe to the third location; and

calculating a magnetic-field vector at the third location based on at least in part the third signal and the reference signal.

4. The method of claim 1, further comprising

detecting a third signal comprising at least a magnetic-field component current at a first location when the second probe is moved to the first location;

and

calculating a magnetic-field vector at the first location based on at least in part the third signal and the reference signal.

5. The method of claim 2, further comprising calculating an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on the electric-field vector distribution.

6. The method of claim 3, further comprising:

calculating a distribution of electric-field vectors at multiple locations by sequentially moving the second probe to each location;

calculating a distribution of magnetic-field vectors at multiple locations by sequentially moving the third probe to each location; and

calculating an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on the electric-field vector distribution and the magnetic-field vector distribution.

7. The method of claim 4, further comprising:

calculating a distribution of electric-field vectors and distribution of magnetic-field vectors at multiple locations by sequentially moving the second probe to each location; and

calculating an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on the distribution of electric-field vectors and distribution of magnetic-field vectors.

14. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 1.

15. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 3.

16. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 4.

17. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 5.

18. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 6.

19. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 7.

20. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 15.

21. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 17.

22. A computer readable medium storing instructions for causing a general purpose computer to perform the calculating steps of claim 20.

8. An apparatus configured to measure an electromagnetic field formed by an electromagnetic radiation source, the apparatus comprising:

a first probe fixedly located near the radiation source for detecting a reference signal comprising at least one of electric-field and magnetic-field component currents;

a second probe near configured to be movable for detecting a signal comprising an electric-field component current at the location that the second probe moves to;

a computation unit configured to calculate the electric-field vector of the electromagnetic field based on signals generated by the first and the second probes; and

a control section configured to move the second probe to scan over the radiation source.

9. The apparatus of claim 8, further comprising a third probe configured to be movable for detecting a signal comprising a magnetic-field component current at the location that the third probe moves to, wherein the computation unit is also configured to calculate a magnetic-field vector of the electromagnetic field based at least in part on signals generated by the first and the third probes.

10. The apparatus of claim 8, wherein the second probe is further configured to detect a signal comprising a magnetic-field component current at the location of the second probe, and the computation unit is further configured to calculate a magnetic-field vector based at least in part on signals generated by the first and the second probes.

11. The apparatus of claim 8, wherein the computation unit is further configured to calculate an electromagnetic-field intensity at a particular location distant from the radiation source, based at least in part on the electric-field vector at multiple locations.

12. The apparatus of claim 9, wherein the computation unit is further configured to calculate a distribution of electric-field vectors and magnetic-field vectors at multiple locations and an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on signals generated from the first, second, and third probes.

13. The apparatus of claim 10, wherein the computation unit is further configured to calculate a distribution of electric-field vectors and magnetic-field vectors at multiple locations and an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on signals generated from the first and second probes.