Apparatus and method for providing snapshot action thermal infrared imaging within automated process control article inspection applications
First Claim
1. A system for providing snapshot action thermal imaging within automated process control article inspection applications comprising:
- a lead salt-based thermal infrared imager configured to support snapshot-mode image acquisition;
an image acquisition zone configured to support the snapshot-mode image acquisition of a part or process;
an image processor configured to receive and process output of the imager in a manner which reduces a two-dimensional infrared spatial image or data set produced by the imager into a specific set of quality- or process-related attributes associated with the part or process within the image acquisition zone; and
a control electronics module configured to provide image acquisition control signals within the system.
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Accused Products
Abstract
This application relates to an apparatus and method for providing snapshot action thermal infrared imaging within automated process control article inspection applications. More specifically, it pertains to the use of snapshot mode lead salt area-array imaging sensors (20) as the imaging front-end in high-speed machine vision inspection systems (12). the relatively low-cost, good measurement sensitivity at temperatures consistent with thermo-electric cooling means, and the ability to be operated in snapshot mode enables lead salt-based image acquisition sensors (20) to be used in a variety of automated process control and article inspection applications.
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Citations
39 Claims
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1. A system for providing snapshot action thermal imaging within automated process control article inspection applications comprising:
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a lead salt-based thermal infrared imager configured to support snapshot-mode image acquisition;
an image acquisition zone configured to support the snapshot-mode image acquisition of a part or process;
an image processor configured to receive and process output of the imager in a manner which reduces a two-dimensional infrared spatial image or data set produced by the imager into a specific set of quality- or process-related attributes associated with the part or process within the image acquisition zone; and
a control electronics module configured to provide image acquisition control signals within the system. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
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30. A method for providing snapshot action thermal infrared imaging within an automated process control article inspection application, the method comprising the steps of:
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simultaneously integrating thermal infrared signals within all pixel sites of a lead salt-based imager based on image acquisition control signals provided by an electronics control module;
providing a two-dimensional infrared spatial image or data set based on the pixel site integrating to a processor; and
processing the two-dimensional infrared spatial image or data set into a set of quality- or process-related attributes associated with a part or process under inspection. - View Dependent Claims (31, 32, 33, 34, 35)
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36. A method for providing snapshot action thermal infrared imaging within an automated process control article inspection application, the method comprising the steps of:
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energizing components within an inspected part or process by applying a controlled voltage or current to the components;
simultaneously integrating thermal infrared signals within all pixel sites of a lead salt-based imager based on image acquisition control signals provided by an electronics control module;
providing a sequence of two-dimensional infrared spatial images or data sets based on the pixel site integrating to a processor; and
processing the two-dimensional infrared spatial images or data sets into a set of quality- or process-related attributes associated with a part or process under inspection. - View Dependent Claims (37, 38, 39)
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Specification