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Vertical microprobes for contacting electronic components and method for making such probes

  • US 20060238209A1
  • Filed: 01/03/2006
  • Published: 10/26/2006
  • Est. Priority Date: 05/07/2002
  • Status: Abandoned Application
First Claim
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1. A compliant probe device for making electric contact with an electronic component, comprising:

  • (A) a tip element;

    (B) an elongated compliant element formed from a plurality of adhered layers of a deposited material adhered to the tip element, wherein at least one of the following criteria is met;

    (1) the elongate compliant element comprises a plurality of steps with a number of the steps separated from adjacent steps by a bridge of material that is common to a lower adjacent step and a higher adjacent step;

    (2) the elongate compliant element comprises at least two compliant springs that are oriented so as to provide balanced compliance under compressive force;

    (3) the compliant element comprises a plurality of compliant spring elements located in parallel;

    (4) the compliant element comprises a plurality of compliant elements a portion of which are in parallel to each other and a portion which are in series with each other;

    (5) the compliant element is located in proximity to a stiffening element such that lateral displacement of the compliant element is hindered upon contact with the stiffening element;

    (6) the compliant element comprises a first spring element in series with a second spring element wherein during compression the first spring element is placed in a net compressive state while the second spring element is placed in a net tensional state;

    or (7) the compliant element comprises a first spring element in series with a second spring element, where the first spring element has a first compliance and the second spring element has a second compliance and where the first and second compliance are different.

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