×

Modulation feature measurement and statistical classification system and method

  • US 20060239338A1
  • Filed: 02/15/2006
  • Published: 10/26/2006
  • Est. Priority Date: 02/15/2005
  • Status: Abandoned Application
First Claim
Patent Images

1. A modulation feature measurement and classification system for classifying a pulsed signal, the modulation feature measurement and classification system comprising:

  • a preprocessor that detects a pulse start and a pulse stop, and that measures pulse duration for the pulsed signal and that converts the pulsed signal into a plurality of digitized baseband in-phase/quadrature samples;

    a phase measurement system that measures short chip counts, long chip counts, phase jump magnitudes, number of phase states, and phase modulation polynomial coefficients for a curve fit to a phase waveform for the pulsed signal; and

    a modulation classifier that determines a modulation type of the pulsed signal based on the measurements of the preprocessor and the phase measurement system using both rules-based and similarity-based classification methods.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×