Nanocrystal coated surfaces

• US 20060240227A1
• Filed: 09/22/2005
• Published: 10/26/2006
• Est. Priority Date: 09/23/2004
• Status: Abandoned Application

• Current Assignee: National Research Council Canada
• Original Assignee: National Research Council Canada
• Inventors: Zhang, Zhijun, Smith, Catherine, Walker, Roy, Wayner, Danial D. M.
• Application Number:
  US11/232,013
• Publication Number:
  US 20060240227A1
• Time in Patent Office: Days
• US Class Current: 428/195.100
• CPC Class Codes: B82Y 15/00 Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
• CPC Class Codes: C03C 17/007 containing a dispersed phase, e.g. particles, fibres or flakes, in a continuous phase
• CPC Class Codes: C03C 17/22 with other inorganic material C03C17/34, C03C17/44 take precedence
• CPC Class Codes: C03C 2217/42 consisting of particles only
• CPC Class Codes: C09K 11/565 with zinc cadmium
• CPC Class Codes: C09K 11/883 with zinc or cadmium
• CPC Class Codes: G01N 33/588 with semiconductor nanocrystal label, e.g. quantum dots
• CPC Class Codes: Y10T 428/24802 Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
• CPC Class Codes: Y10T 428/25 Web or sheet containing structurally defined element or component and including a second component containing structurally defined particles

Abstract

The present invention provides novel calibration devices for use with fluorescent nanocrystal labels. Methods of preparing and using the calibration devices are also provided. Monodispersed populations of nanocrystals are deposited on surfaces. The monodispersed populations are obtained by dissolving the nanocrystals in a polar solvent.

Claims

1. A calibration device for a fluorescence detector, said device comprising at least one deposit of essentially uniformly deposited nanocrystals.

2. A calibration device according to claim 1, wherein the deposited nanocrystals form a spot having a diameter from about 1 to 1000 microns.

3. A calibration device according to claim 2 wherein the spot has a diameter from about 10 to 500 microns.

4. A calibration device according to claim 1, wherein the deposit comprises at least one nanocrystal having a core selected from the group consisting of cadmium sulfide (CdS), cadmium selenide (CdSe), cadmium telluride (CdTe), zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), mercury sulfide (HgS), mercury selenide (HgSe), mercury telluride (HgTe), aluminum nitride (AlN), aluminum sulfide (AlS), aluminum phosphide (AlP), aluminum arsenide (AlAs), aluminum antimonide (AlSb), lead sulfide (PbS), lead selenide (PbSe), lead telluride (PbTe), gallium arsenide (GaAs), gallium nitride (GaN), gallium phosphide (GaP), gallium antimonide (GaSb), indium arsenide (InAs), indium nitride (InN), indium phosphide (InP), indium antimonide (InSb), thallium arsenide (TlAs), thallium nitride (TlN), thallium phosphide (TlP), thallium antimonide (TlSb), zinc cadmium selenide (ZnCdSe), indium gallium nitride (InGaN), indium gallium arsenide (InGaAs), indium gallium phosphide (InGaP), aluminum indium nitride (AlInN), indium aluminum phosphide (InAlP), indium aluminum arsenide (InAlAs), aluminum gallium arsenide (AlGaAs), aluminum gallium phosphide (AlGaP), aluminum indium gallium arsenide (AlInGaAs), aluminum indium gallium nitride (AlInGaN) and the like including mixtures of such materials.

5. A calibration device according to claim 4, wherein the nanocrystal further comprises a shell of a material other than that of the core wherein the shell material is selected from the group consisting of cadmium sulfide (CdS), cadmium selenide (CdSe), cadmium telluride (CdTe), zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), mercury sulfide (HgS), mercury selenide (HgSe), mercury telluride (HgTe), aluminum nitride (AlN), aluminum sulfide (AlS), aluminum phosphide (AlP), aluminum arsenide (AlAs), aluminum antimonide (AlSb), lead sulfide (PbS), lead selenide (PbSe), lead telluride (PbTe), gallium arsenide (GaAs), gallium nitride (GaN), gallium phosphide (GaP), gallium antimonide (GaSb), indium arsenide (InAs), indium nitride (InN), indium phosphide (InP), indium antimonide (InSb), thallium arsenide (TlAs), thallium nitride (TlN), thallium phosphide (TlP), thallium antimonide (TlSb), zinc cadmium selenide (ZnCdSe), indium gallium nitride (InGaN), indium gallium arsenide (InGaAs), indium gallium phosphide (InGaP), aluminum indium nitride (AlInN), indium aluminum phosphide (InAlP), indium aluminum arsenide (InAlAs), aluminum gallium arsenide (AlGaAs), aluminum gallium phosphide (AlGaP), aluminum indium gallium arsenide (AlInGaAs), aluminum indium gallium nitride (AlInGaN), mixtures thereof and the like.

6. A calibration device according to claim 1 wherein the nanocrystal is hydrophilic.

7. A calibration device according to claim 2 wherein the nanocrystal comprises a CdSe core.

8. A calibration device according to claim 3 wherein the nanocrystal comprises a ZnS shell.

9. A calibration device according to claim 1, wherein the nanocrystals are functionalized to be soluble in a polar solvent.

10. A calibration device according to claim 1, wherein the device comprises a plurality of deposits in the form of spots.

11. A calibration device according to claim 10 wherein the nanocrystals vary in size or number from one deposit to another.

12. A calibration device according to claim 11 comprising a series of spots wherein the number of deposited nanocrystals increases throughout the series of spots.

13. A calibration device according to claim 1 wherein the deposit of nanocrystals is overlaid with a sol-gel film.

14. A process for preparing a layer of nanocrystals, said process comprising:

i. preparing a solution of nanocrystals in a polar solvent;

ii. depositing the solution on a surface; and

iii. coating the surface with a sol-gel film.

15. A process according to claim 14, wherein the nanocrystal comprises a core selected from the group consisting of cadmium sulfide (CdS), cadmium selenide (CdSe), cadmium telluride (CdTe), zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), mercury sulfide (HgS), mercury selenide (HgSe), mercury telluride (HgTe), aluminum nitride (AlN), aluminum sulfide (AlS), aluminum phosphide (AlP), aluminum arsenide (AlAs), aluminum antimonide (AlSb), lead sulfide (PbS), lead selenide (PbSe), lead telluride (PbTe), gallium arsenide (GaAs), gallium nitride (GaN), gallium phosphide (GaP), gallium antimonide (GaSb), indium arsenide (InAs), indium nitride (InN), indium phosphide (InP), indium antimonide (InSb), thallium arsenide (TlAs), thallium nitride (TlN), thallium phosphide (TlP), thallium antimonide (TlSb), zinc cadmium selenide (ZnCdSe), indium gallium nitride (InGaN), indium gallium arsenide (InGaAs), indium gallium phosphide (InGaP), aluminum indium nitride (AlInN), indium aluminum phosphide (InAlP), indium aluminum arsenide (InAlAs), aluminum gallium arsenide (AlGaAs), aluminum gallium phosphide (AlGaP), aluminum indium gallium arsenide (AlInGaAs), aluminum indium gallium nitride (AlInGaN) and the like including mixtures of such materials.

16. A process according to claim 15 wherein the nanocrystal further comprises a shell of a material other than that of the core wherein the shell material is selected from the group consisting of cadmium sulfide (CdS), cadmium selenide (CdSe), cadmium telluride (CdTe), zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telluride (ZnTe), mercury sulfide (HgS), mercury selenide (HgSe), mercury telluride (HgTe), aluminum nitride (AlN), aluminum sulfide (AlS), aluminum phosphide (AlP), aluminum arsenide (AlAs), aluminum antimonide (AlSb), lead sulfide (PbS), lead selenide (PbSe), lead telluride (PbTe), gallium arsenide (GaAs), gallium nitride (GaN), gallium phosphide (GaP), gallium antimonide (GaSb), indium arsenide (InAs), indium nitride (InN), indium phosphide (InP), indium antimonide (InSb), thallium arsenide (TlAs), thallium nitride (TlN), thallium phosphide (TlP), thallium antimonide (TlSb), zinc cadmium selenide (ZnCdSe), indium gallium nitride (InGaN), indium gallium arsenide (InGaAs), indium gallium phosphide (InGaP), aluminum indium nitride (AlInN), indium aluminum phosphide (InAlP), indium aluminum arsenide (InAlAs), aluminum gallium arsenide (AlGaAs), aluminum gallium phosphide (AlGaP), aluminum indium gallium arsenide (AlInGaAs), aluminum indium gallium nitride (AlInGaN), mixtures thereof and the like.

17. A process according to claim 14 wherein the nanocrystal is hydrophilic.

18. A process according to claim 15 wherein the nanocrystal comprises a CdSe core.

19. A process according to claim 16 wherein the nanocrystal comprises a ZnS shell.

20. A process according to claim 14 wherein the nanocrystal comprises a core of a metallic material wherein the metallic material is selected from the group consisting of gold (Au), silver (Ag), cobalt (Co), iron (Fe), nickel (Ni), copper (Cu), manganese (Mn), alloys thereof and alloy combinations.

21. A process according to claim 14 wherein the polar solvent is selected from the group consisting of ethanol, methanol, propanol, butanol, glycol, ether, polyol, polyether, mixtures thereof and the like.

22. A process according to claim 21 wherein the solvent is ethylene glycol.

23. A process according to claim 14 wherein the sol-gel film comprises tetraethyl orthosilicate.

24. A surface comprising at least one region of dispersed nanocrystals coated with a sol-gel film.

25. A microscope slide comprising a surface as defined in claim 24.

26. A microscope slide according to claim 25 comprising a plurality of regions of nanocrystals, wherein the density of nanocrystals varies from region to region.

27. A microscope slide according to claim 26 comprising at least two different types of nanocrystals.

28. A DNA chip comprising a nanocrystal array calibration barcoding.

29. A method of quantifying a binding reaction comprising:

i) providing an array of an immobilized ligand on the surface of a slide;

ii) contacting the array with a sample;

iii) detecting binding of the sample to the ligand using a nanocrystal detector;

iv) comparing the signal obtained by binding of the sample to the signal generated by a series of spots, each spot comprising a predetermined standardized homogenous dispersion of nanocrystals; and

v) determining the extent of binding based on the number of nanocrystals bound to the sample spot as compared to a standardized spot.