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Determining layer thickness using photoelectron spectroscopy

  • US 20060243904A1
  • Filed: 04/29/2005
  • Published: 11/02/2006
  • Est. Priority Date: 04/29/2005
  • Status: Active Grant
First Claim
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1. A method for determining a thickness of a layer using electron spectroscopy comprising:

  • determining a first predictive intensity function for a first electron species of the layer dependent on the thickness of the layer;

    determining a second predictive intensity function for a second electron species of the layer dependent on the thickness of the layer;

    determining a ratio of the first and second predictive intensity functions; and

    iterating the ratio to determine the thickness of the layer.

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