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X-ray backscatter inspection with coincident optical beam

  • US 20060245548A1
  • Filed: 04/21/2006
  • Published: 11/02/2006
  • Est. Priority Date: 04/22/2005
  • Status: Abandoned Application
First Claim
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1. An inspection system for inspecting an object, the system comprising:

  • a. a source of penetrating radiation characterized by a range of wavelengths;

    b. a spatial modulator for forming the penetrating radiation into a beam of penetrating radiation for irradiating the object with a profile scanned in two dimensions, the object disposed entirely outside the enclosing body;

    c. a remote spatial registration mechanism for defining an area at the object substantially contiguous with the profile scanned by the penetrating radiation; and

    d. a detector module capable of detecting a scatter signal of penetrating radiation from contents of the object.

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