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Semiconductor memory component and method for testing semiconductor memory components having a restricted memory area (partial good memories)

  • US 20060250864A1
  • Filed: 03/15/2006
  • Published: 11/09/2006
  • Est. Priority Date: 03/15/2005
  • Status: Active Grant
First Claim
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1. A semiconductor memory component comprising:

  • a memory cell array, including data word groups having a desired number of memory cells storing data bits;

    a test write register for buffer-storing a primary test data word read into the memory cell array at a test address; and

    comparator units for comparing mutually corresponding data bits of the respective primary test data word and of a secondary test data word read out from the memory cell array from the test address, in which case, when mutually corresponding data bits in the primary and secondary test data words match, an error free signal is generated in each case on PF signal lines respectively assigned to one of the comparator units,

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