Probing system for integrated circuit devices

• US 20060252375A1
• Filed: 08/12/2005
• Published: 11/09/2006
• Est. Priority Date: 05/04/2005
• Status: Abandoned Application

• Current Assignee: National Tsing Hua University
• Original Assignee: National Tsing Hua University
• Inventors: Huang, Chih-Tsun, Hsing, Yu-Tsao, Wu, Cheng-Wen
• Application Number:
  US11/203,380
• Publication Number:
  US 20060252375A1
• Time in Patent Office: Days
• US Class Current: 455/67.110
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/303 of integrated circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: H04B 17/0085 using test signal generators

Abstract

The present invention discloses a probing system for integrated circuit devices, which transmits testing data between an automatic test equipment (ATE) and an integrated circuit device. The ATE includes a first transceiving module, and the integrated circuit device includes a core circuit, a built-in self-test (BIST) circuit electrically connected to the core circuit, a controller configured to control the operation of the BIST circuit, and a second transceiving module configured to exchange testing data with the first transceiving module. Preferably, the integrated circuit device further includes a clock generator and a power regulator electrically connected to the second transceiving module, wherein the ATE transmits a radio frequency signal via the first transceiving module, and the second transceiving module receives the radio frequency signal to drive the power regulator to generate power for the integrated circuit device to initiate the BIST circuit.

Claims

1. A probing system for integrated circuit devices, comprising:

a testing machine being comprised of a first transceiving module; and

an integrated circuit device under test, said integrated circuit device comprising;

a core circuit;

a self-test circuit electrically connected to the core circuit;

a controller configured to control operation of the self-test circuit; and

a second transceiving module configured to exchange data with the first transceiving module.

2. The probing system for integrated circuit devices of claim 1, wherein the integrated circuit device further comprises:

a clock generator electrically connected to the second transceiving module; and

a power regulator electrically connected to the second transceiving module,

wherein the testing machine transmits a radio frequency signal by the first transceiving module and the second transceiving module receives the radio frequency signal to drive the power regulator to generate the operation power for the integrated circuit device.

3. The probing system for integrated circuit devices of claim 1, wherein the integrated circuit device is positioned on a circuit board, and acquires the operation power from the circuit board.

4. The probing system for integrated circuit devices of claim 1, further comprising:

a conveying device, the integrated circuit device being transported to a predetermined position by the conveying device.

5. The probing system for integrated circuit devices of claim 4, wherein the conveying device is electrically connected to a power supply, and wherein the integrated circuit device acquires operation power from the conveying device.

6. The probing system for integrated circuit devices of claim 1, wherein the core circuit is comprised of a memory circuit, a logic circuit, or an analog circuit.

7. The probing system for integrated circuit devices of claim 1, wherein the testing machine further comprises:

a physical layer module electrically connected to the first transceiving module; and

a testing unit electrically coupled to the physical layer module.

8. The probing system for integrated circuit devices of claim 1, wherein the testing machine further comprises:

a physical layer module electrically connected to the first transceiving module; and

a diagnosis unit electrically coupled to the physical layer module.

9. The probing system for integrated circuit devices of claim 1, wherein the integrated circuit device further comprises:

a tag register for storing an identification of the integrated circuit device.

10. A probing system for integrated circuit devices, comprising:

a testing machine being comprised of a first transceiving module; and

a wafer having a plurality of integrated circuit devices and being comprised of;

a core circuit;

a tag register for storing an identification of the integrated circuit device;

a self-test circuit electrically connected to the core circuit;

a controller configured to control the operation of the core circuit; and

a second transceiving module configured to exchange data with the first transceiving module through a wireless communication.

11. The probing system for integrated circuit devices of claim 10, wherein the wafer further comprises a power supply line surrounding the integrated circuit device, and wherein the integrated circuit device acquires operation power from the power supply line.

12. The probing system for integrated circuit devices of claim 11, wherein the power supply line is positioned on a cutting line of the wafer.

13. The probing system for integrated circuit devices of claim 10, wherein the integrated circuit device further comprises:

a clock generator electrically connected to the second transceiving module; and

a power regulator electrically connected to the second transceiving module,

wherein the testing machine transmits a radio frequency signal by the first transceiving module and the second transceiving module receives the radio frequency signal to drive the power regulator to generate the operation power for the integrated circuit device.

14. The probing system for integrated circuit devices of claim 10, wherein the core circuit is comprised of a memory circuit, a logic circuit, or an analog circuit.

15. The probing system for integrated circuit devices of claim 10, wherein the testing machine further comprises:

a physical layer module electrically connected to the first transceiving module; and

a testing unit electrically coupled to the physical layer module.

16. The probing system for integrated circuit devices of claim 10, wherein the testing machine further comprises:

a physical layer module electrically connected to the first transceiving module; and

a diagnosis unit electrically coupled to the physical layer module.