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Probing system for integrated circuit devices

  • US 20060252375A1
  • Filed: 08/12/2005
  • Published: 11/09/2006
  • Est. Priority Date: 05/04/2005
  • Status: Abandoned Application
First Claim
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1. A probing system for integrated circuit devices, comprising:

  • a testing machine being comprised of a first transceiving module; and

    an integrated circuit device under test, said integrated circuit device comprising;

    a core circuit;

    a self-test circuit electrically connected to the core circuit;

    a controller configured to control operation of the self-test circuit; and

    a second transceiving module configured to exchange data with the first transceiving module.

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