CAPACITY MANAGEMENT IN A WAFER FABRICATION PLANT

• US 20060259173A1
• Filed: 05/12/2005
• Published: 11/16/2006
• Est. Priority Date: 05/12/2005
• Status: Active Grant

• Current Assignee: Systems On Silicon Manufacturing Company Pte Limited (NXP Semiconductors NV)
• Original Assignee: Systems On Silicon Manufacturing Company Pte Limited (NXP Semiconductors NV)
• Inventors: Su, Hsiang Ju, Ho, Yew Kuan, Chin, Chen Chong
• Granted Patent: US 7,142,937 B1
• Time in Patent Office: Days
• US Class Current: 700/99
• CPC Class Codes: G05B 19/41865 characterised by job scheduling, process planning, material flow
• CPC Class Codes: G05B 2219/32263 Afo products, their components to be manufactured, lot selective
• CPC Class Codes: G05B 2219/32294 Maximize throughput of cell
• CPC Class Codes: G06Q 10/0631 Resource planning, allocation, distributing or scheduling for enterprises or organisations
• CPC Class Codes: Y02P 90/02 Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

In a wafer fabrication plant, the capacity management process 10 begins with identifying an initial capacity plan based on a demand plan (step 12). For each Product Group in the initial capacity plan a consumption sensitivity factor is defined (step 14). Next, a bottleneck capability variable is calculated (step 16). The capacity boundaries for each of the product groups are next determined (step 18). Thereafter, in the first of two branches, a determination of maximum wafer output is then performed for changing Product Group mixes to determine a maximum (step 20). The Product Group mix giving maximum wafer output is then determined for the fabrication plant (step 22). In the second branch, a determination of maximum profit is performed for changing Product Group mixes (step 24), then the Product Group mix giving maximum profit is determined for the fabrication plant (step 26).

Claims

1-5. -5. (canceled)

6. A computer program product for the management of capacity in a wafer fabrication plant comprising a computer program stored on a storage medium, said computer program performing the steps of:

(a) calculating a bottleneck capacity factor for an initial product group mix of an initial capacity plan, the bottleneck capacity factor representing available machine hours per a given time period for said initial capacity plan;

(b) calculating maximum capacity values for respective product groups of the initial product group mix in the initial capacity plan, each respective maximum capacity value representing a maximum number of wafers of the respective product group output by said fabrication plant per said given time period;

(c) algorithmically determining total output values for respective different product group mixes, including for the initial product group mix of the initial capacity plan, subject to said bottleneck capacity factor and said respective maximum capacities values not being exceeded, each total output value representing a sum of individual output values of all the product groups in the respective different product group mixes by said fabrication plant per said given time period;

(d) determining a maximum one of said total output values; and

(e) providing a modified product group mix, the product group mix being one of said different product group mixes corresponding to said maximum total output value.

7. A computer program product according to claim 6, wherein said bottleneck capacity factor is calculated as the sum of weighted maximum capacities for the respective product groups of the initial product group mix.

8. A computer program product according to claim 7, wherein each said weighted maximum capacities is proportional to the sum of passes of a bottleneck tool for each piece of the respective product groups and is inversely proportional to production rates of the respective product groups.

9. A computer program product according to claim 6, wherein, in step (c), said each total output value comprises a total wafer output value being the sum of individual wafer output values of all the product groups in the respective different product group mixes by said fabrication plant per said given time period.

10. A computer program product according to claim 6, wherein, in step (c), said each total output value comprises a total profit value being the sum of individual profit values of all the product groups in the respective different product group mixes by said fabrication plant per said given time period.

11. A method of management of capacity in a wafer fabrication plant comprising a computer program stored on a storage medium, said computer program performing the steps of:

(a) calculating a bottleneck capacity factor for an initial product group mix of an initial capacity plan, the bottleneck capacity factor representing available machine hours per a given time period for said initial capacity plan;

(b) calculating maximum capacity values for respective product groups of the initial product group plan in the initial capacity plan, each respective maximum capacity value representing a maximum number of wafers of the respective product group output by said fabrication plant per said given time period;

(c) algorithmically determining total output values for respective different product group mixes, including for the initial product group mix of the initial capacity plan, subject to said bottleneck capacity factor and said respective maximum capacity values not being exceeded, each total output value representing a sum of individual output values of all the product groups in the respective different product group mixes by said fabrication plant per said given time period;

(d) determining a maximum one of said total output values; and

(e) utilizing a modified product group mix, the modified product group mix being one of said different product group mixes corresponding to said maximum total output value, in operation of the fabrication plant.

12. A method according to claim 11, wherein said bottleneck capacity factor is calculated as the sum of weighted maximum capacities for the respective product groups of the initial product group mix.

13. A method according to claim 12, wherein each said weighted maximum capacities is proportional to the sum of passes of a bottleneck tool for each piece of the respective product groups and is inversely proportional to production rates of the respective product groups.

14. A method according to claim 11, wherein, in step (c), said each total output value comprises a total wafer output value being the sum of individual wafer output values of all the product groups in the respective different product group mixes by said fabrication plant per said given time period.

15. A method according to claim 11, wherein, in step (c), said each total output value comprises a total profit value being the sum of individual profit values of all the product groups in the respective different product group mixes by said fabrication plant per said given time period.