Circuits and methods for current measurements referred to a precision impedance
2 Assignments
0 Petitions
Accused Products
Abstract
Circuitry and methods for obtaining accurate measurements of current supplied by an integrated circuit are provided. Current calculations are performed using information from a precision termination resistor and from the ratio relationship of two on-chip resistors. The invention provides a way to obtain accurate current measurements without the use of component trimming.
17 Citations
69 Claims
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1-35. -35. (canceled)
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36. A system comprising:
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an integrated circuit;
a first impedance disposed on the integrated circuit;
a second impedance disposed on the integrated circuit;
a first measurement device coupled to the first impedance configured to measure a first voltage drop across the first impedance;
a second measurement device coupled to the second impedance configured to measure a second voltage drop across the second impedance;
a third impedance disposed outside of the integrated circuit;
a third measurement device coupled to the third impedance configured to measure a third voltage drop across the third impedance; and
processing circuitry that utilizes information from the first, second, and third measurement devices to determine a current supplied by the integrated circuit. - View Dependent Claims (37, 38, 39, 40, 41, 42, 43, 44)
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45. A system comprising:
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an integrated circuit;
a first resistive element disposed on the integrated circuit;
a second resistive element disposed outside of the integrated circuit;
a first measurement device coupled to the first resistive element configured to measure a first voltage drop across the first resistive element;
a second measurement device coupled to the second resistive element configured to measure a second voltage drop across the second resistive element; and
processing circuitry that utilizes information from the first and second measurement devices to determine a current supplied by the integrated circuit. - View Dependent Claims (46, 47, 48, 49, 50, 51, 52)
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53. A system comprising:
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an integrated circuit;
a reference voltage source;
a first measurement device configured to measure voltage levels across two impedance elements located on the integrated circuit relative to the reference voltage source;
a second measurement device configured to measure the voltage level across an impedance element external to the integrated circuit relative to the reference voltage source; and
processing circuitry that utilizes information from the first and second measurement devices to determine a current supplied by the integrated circuit. - View Dependent Claims (54, 55, 56, 57, 58, 59, 60, 61)
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62. A method comprising:
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providing an integrated circuit;
providing a first impedance disposed on the integrated circuit;
providing a second impedance disposed on the integrated circuit;
measuring a first voltage drop across the first impedance;
measuring a second voltage drop across the second impedance;
providing a third impedance disposed outside of the integrated circuit;
measuring a third voltage drop across the third impedance; and
utilizing the first, second, and third measurements to calculate a supplied current from the integrated circuit. - View Dependent Claims (63, 64, 65, 66, 67, 68, 69)
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Specification