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Method and system to controlling an electronic instrument for metrological measurement

  • US 20060266245A1
  • Filed: 11/13/2003
  • Published: 11/30/2006
  • Est. Priority Date: 11/15/2002
  • Status: Active Grant
First Claim
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1. A control system of an electronic instrument for metrological measurements, comprising:

  • a handling application operable to control the instrument; and

    a control application operable to verify integrity of said handling application, said control application operable to generate a certification code for the handling application in response to verifying that the integrity is maintained.

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