Method and system to controlling an electronic instrument for metrological measurement
First Claim
Patent Images
1. A control system of an electronic instrument for metrological measurements, comprising:
- a handling application operable to control the instrument; and
a control application operable to verify integrity of said handling application, said control application operable to generate a certification code for the handling application in response to verifying that the integrity is maintained.
12 Assignments
0 Petitions
Accused Products
Abstract
Control system of an electronic instrument for metrological measurements, comprising an electronic local processing unit including a handling application of said instrument. The system includes a control application for said handling application, which can be associated with said local processing unit, said control application being suitable for generating a univocal certification code for the application.
-
Citations
21 Claims
-
1. A control system of an electronic instrument for metrological measurements, comprising:
-
a handling application operable to control the instrument; and
a control application operable to verify integrity of said handling application, said control application operable to generate a certification code for the handling application in response to verifying that the integrity is maintained. - View Dependent Claims (2, 3, 4, 5, 6, 7, 12, 13, 14, 15, 16)
-
-
8. A method for monitoring an electronic instrument for metrological measurements, comprising:
-
receiving information associated with a handling application for the instrument and locally stored; and
issuing a certification code associated with the handling application based on the information and operable to indicate that integrity of the handling application has been maintained. - View Dependent Claims (9, 10, 11, 17, 18, 19, 20, 21)
-
Specification