RFID device variable test systems and methods

• US 20060271328A1
• Filed: 05/25/2005
• Published: 11/30/2006
• Est. Priority Date: 05/25/2005
• Status: Active Grant

• Current Assignee: Avery Dennison Retail Information Services LLC (Avery Dennison Corporation)
• Original Assignee: Avery Dennison Corporation
• Inventors: Forster, Ian J.
• Granted Patent: US 7,359,823 B2
• Time in Patent Office: Days
• US Class Current: 702/122
• CPC Class Codes: G01R 31/312 by capacitive methods
• CPC Class Codes: G06K 19/0701 at least one of the integrated circuit chips comprising an arrangement for power management
• CPC Class Codes: G06K 7/0008 General problems related to the reading of electronic memory record carriers, independent of its reading method, e.g. power transfer
• CPC Class Codes: G06K 7/0095 Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly testing of electrical circuits G01R31/28
• CPC Class Codes: G06K 7/10465 the interrogation device being capable of self-diagnosis, e.g. in addition to or as part of the actual interrogation process testing of electrical circuits in general G01R31/28

Abstract

Systems and methods are disclosed herein to provide variable test techniques for RFID devices. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) test system includes an RFID reader adapted to provide an RF signal to an RFID device, wherein a signal level of the RF signal changes as the RFID device moves through a test region. The performance level of the RFID device is determined based upon the number of times the RFID device responds to the RF signal.

Claims

1. A radio frequency identification (RFID) test system comprising:

an RFID reader adapted to provide an RF signal to an RFID device, wherein a signal level of the RF signal changes as the RFID device moves through a test region; and

wherein a performance level of the RFID device is determined based upon the number of times the RFID device responds to the RF signal.

2. The RFID test system of claim 1, further comprising a transmission line, wherein the RFID reader provides the RF signal to the RFID device via the transmission line.

3. The RFID test system of claim 2, wherein the signal level of the RF signal provided to the RFID device is changed as it moves through the test region by varying a distance between the transmission line and the RFID device.

4. The RFID test system of claim 2, further comprising a first element disposed between the transmission line and the RFID device, wherein the signal level of the RF signal provided to the RFID device is changed as it moves through the test region by varying a dielectric constant of the first element.

5. The RFID test system of claim 2, wherein the signal level of the RF signal provided to the RFID device is changed as it moves through the test region due to at least one of attenuation of the RF signal as it propagates through the transmission line and variation of a surface area of the transmission line.

6. The RFID test system of claim 1, further comprising a plurality of short-range couplers, wherein the RFID reader provides the RF signal to the RFID device via the short-range couplers.

7. The RFID test system of claim 6, further comprising a plurality of attenuators adapted to attenuate the RF signal to form an RF field strength profile provided to the RFID device via the short-range couplers.

8. The RFID test system of claim 6, wherein the short-range couplers provide the RF signal to the RFID device in a near field region by at least one of an electric field, a magnetic field, and a direct electrical connection.

9. The RFID test system of claim 1, further comprising an antenna, wherein the RFID reader provides the RF signal to the RFID device via the antenna, with the signal level of the RF signal provided to the RFID device changing due to at least one of a change in distance between the RFID device and the antenna and a radiation pattern of the antenna.

10. The RFID test system of claim 1, wherein the signal level of the RF signal provided to the RFID device changes in at least one of a linear manner, a non-linear manner, and a stepped manner.

11. The RFID test system of claim 1, further comprising a plurality of RFID devices, wherein the RFID devices are arranged on a common carrier web and the performance level of the RFID devices are determined based upon the number of times the RFID devices respond to the RF signal.

12. The RFID test system of claim 1, wherein the test region comprises a plurality of test environments, with at least one of a frequency of the RF signal, a direction of the RF signal, and a transmission type of the RF signal varied for at least one of the test environments.

13. The RFID test system of claim 12, wherein the number of times the RFID device responds to the RF signal in each of the test environments determines the performance level of the RFID device.

14. A radio frequency identification (RFID) communication system comprising:

means for providing an RF signal for one or more RFID devices;

means for varying a parameter of the RF signal provided to the one or more RFID devices as the one or more RFID devices travel through a test region; and

wherein a corresponding performance level for the one or more RFID devices is determined based upon the corresponding number of times the one or more RFID devices respond to the RF signal.

15. The RFID test system of claim 14, wherein the parameter comprises at least one of a field strength, a direction, a transmission type, and a frequency of the RF signal.

16. The RFID test system of claim 14, wherein the test region comprises a plurality of test environments.

17. The RFID test system of claim 16, wherein the number of times the one or more RFID devices respond to the RF signal in each of the test environments is weighted to determine the performance level for the one or more RFID devices.

18. The RFID test system of claim 14, wherein the RFID devices comprise at least one of RFID tags, RFID labels, RFID chips, RFID straps, and RFID inlays.

19. The RFID test system of claim 14, wherein the varying means provides the RF signal to the one or more RFID devices in a near field region by at least one of an electric field, a magnetic field, and a direct electrical connection.

20. The RFID test system of claim 14, wherein the parameter of the RF signal provided to the one or more RFID devices varies in at least one of a linear manner, a non-linear manner, and a stepped manner.

21. A method of testing radio frequency identification (RFID) devices, the method comprising:

providing an RF signal for one or more RFID devices;

varying a parameter of the RF signal provided to the one or more RFID devices as the one or more RFID devices travel through a test region; and

determining a corresponding performance level for the one or more RFID devices based upon the number of times the corresponding one or more RFID devices respond to the RF signal.

22. The method of claim 21, wherein the parameter comprises a field strength that is varied in a non-linear manner as the one or more RFID devices travel through the test region.

23. The method of claim 21, wherein the one or more RFID devices are arranged on a common carrier web.

24. The method of claim 21, further comprising adjusting a performance level threshold for the one or more RFID devices based upon the location of defective RFID devices.

25. The method of claim 21, wherein the test region comprises a plurality of test environments.

26. The method of claim 25, wherein a corresponding parameter is varied in each of the test environments.

27. The method of claim 21, wherein the parameter comprises at least one of a field strength, a direction, a transmission type, and a frequency of the RF signal.