Electrical contact probe with compliant internal interconnect

• US 20060279301A1
• Filed: 06/08/2006
• Published: 12/14/2006
• Est. Priority Date: 06/10/2005
• Status: Active Grant

• Current Assignee: Xcerra Corporation (COHU Incorporated)
• Original Assignee: Delaware Capital Formation Incorporated (Dover Corporation)
• Inventors: Treibergs, Valts
• Granted Patent: US 7,256,593 B2
• Time in Patent Office: Days
• US Class Current: 324/754.50
• CPC Class Codes: G01R 1/0466 concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
• CPC Class Codes: G01R 1/06722 Spring-loaded

Abstract

A compliant electrical interconnect having a first component and a second component interlockingly engaged with the first component. Each component has two cantilever arms lockingly engaged and continuously biased against each other. Contact springs are captivated by the cantilever arms providing a contact force for the first and second components.

Claims

1. A compliant electrical interconnect comprising:

a first component;

a second component engaged with the first component;

at least one of the first component or the second component having two biasing cantilever arms for locking engagement with the other component;

at least one spring member captivated by the cantilever arms providing a contact force.

2. The interconnect of claim 1, wherein the cantilever arms have an interlocking tab at the end of each arm.

3. The interconnect of claim 1, wherein both the first component and the second component have two cantilever arms.

4. The interconnect of claim 1, wherein there is a spring member captivated by each cantilever arm.

5. The interconnect of claim 2, wherein the cantilever arms have a tapered surface for flexible engagement by the interlocking tabs.

6. The interconnect of claim 1, wherein the first component has a probe tip for contacting a test location.

7. The interconnect of claim 6, wherein the second component has a probe tip for contacting a printed circuit board.

8. The interconnect of claim 3, wherein the two cantilever arms of the first component perpendicularly interlock with the two cantilever arms of the second component.

9. The interconnect of claim 1, wherein the biasing means is a compression spring.

10. The interconnect of claim 1, wherein the biasing means is an extension spring.

11. The interconnect of claim 1, further including a second compliant electrical interconnect for forming a Kelvin connection.

12. An electrical contact probe with compliant internal interconnect comprising:

a plunger having two biasing cantilever arms;

a barrel having two biasing cantilever arms;

interlocking tabs located on of each cantilever arm to interlock the plunger and the barrel; and

at least one spring captivated by the cantilever arms to provide a contact force for the barrel and the plunger.

13. The probe of claim 12, wherein there are two springs captivated by the cantilever arms.

14. The probe of claim 12, wherein the cantilever arms have a tapered surface for flexible engagement by the interlocking tabs.

15. The probe of claim 12, wherein the two cantilever arms of the plunger perpendicularly interlock with the two cantilever arms of the barrel.

16. The probe of claim 12, wherein the spring is a compression spring.

17. The probe of claim 12, further comprising an electrical contact bump positioned on an end of each cantilever arm of the plunger and the barrel.

18. An electrical contact probe comprising:

a plunger having a contact tip;

a barrel having a contact tip; and

a latching mechanism comprising two cantilever arms having interlocking tabs located at an end of the two cantilever arms extending from either the plunger or the barrel and a flange having an enlarged head extending from the other of the plunger or the barrel for reciprocating receipt between the cantilever arms; and

at least one spring member captivated between the barrel and the plunger providing a contact force for the barrel and the plunger.

19. The probe of claim 18, wherein there are two spring members positioned on either side of the latching mechanism.

20. The probe of claim 18, wherein there is one spring member positioned around the latching mechanism.