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Condition-analyzing device

  • US 20060279428A1
  • Filed: 06/03/2004
  • Published: 12/14/2006
  • Est. Priority Date: 06/09/2003
  • Status: Active Grant
First Claim
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1. A condition analysis apparatus comprising:

  • a three-dimensional sensor for measuring, at a plurality of sampling points, sampling-point-moves in a height direction of an object existing in a target area; and

    area definition means for defining an area where a plurality of the sampling-point-moves are in the generally same phase.

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