Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system

• US 20060280377A1
• Filed: 08/25/2006
• Published: 12/14/2006
• Est. Priority Date: 03/01/2001
• Status: Active Grant

• Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Original Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Inventors: Kimura, Hajime
• Granted Patent: US 7,417,676 B2
• Time in Patent Office: Days
• US Class Current: 382/275
• CPC Class Codes: H04N 9/30 using solid-state colour display devices

Abstract

A defective pixel specifying method and a defective pixel specifying system for a semiconductor device having a defective pixel are provided. Also provided are an image correcting method and an image correcting system for making a defective pixel inconspicuous on the screen when a read image is displayed. The present invention determines whether or not there is a defective pixel for each pixel and specifies the coordinate of the defective pixel using image signals obtained by reading a plurality of images. The image signal of the defective pixel is set based on the image signals of the pixels adjacent to the defective pixel to correct the image of the subject read.

Claims

1. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

reading a first calibration sheet to obtain a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

reading a second calibration sheet to obtain a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first difference between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first difference of each of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixel by obtaining a second difference between the first difference of each of the plurality of pixels and the value of selected from a modal value, an average value and a maximum value of the first difference of the plurality of pixels.

3. A method of determining a defective pixel according to claim 1, wherein the first calibration sheet is white and the second calibration sheet is black.

11. A method of determining a defective pixel according to claim 1, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

19. A method of determining a defective pixel according to claim 1, wherein the pixel portion further has a thin film transistor.

27. A method of determining a defective pixel according to claim 1, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.

2. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

reading a first calibration sheet to obtain a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

reading a second calibration sheet to obtain a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first ratio between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixel by obtaining a second ratio between the first ratio of the plurality of pixels and the value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels.

4. A method of determining a defective pixel according to claim 2, wherein the first calibration sheet is white and the second calibration sheet is black.

12. A method of determining a defective pixel according to claim 2, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

20. A method of determining a defective pixel according to claim 2, wherein the pixel portion further has a thin film transistor.

28. A method of determining a defective pixel according to claim 2, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.

5. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

obtaining a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

reading a calibration sheet to obtain a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first difference between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first difference of each of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixel by obtaining a second difference between the first difference of each of the plurality of pixels and the value of selected from a modal value, an average value and a maximum value of the first difference of the plurality of pixels,

wherein the first image signal of each of the plurality of pixels is obtained while T>

{C×

Vp/Id} is satisfied, where T is an accumulation time, C is a capacitance of the photoelectric conversion element, Vp is a voltage applied to the photoelectric conversion element.

13. A method of determining a defective pixel according to claim 5, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

21. A method of determining a defective pixel according to claim 5, wherein the pixel portion further has a thin film transistor.

29. A method of determining a defective pixel according to claim 5, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.

6. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

obtaining a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

reading a calibration sheet to obtain a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first ratio between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixels by obtaining a second ratio between the first ratio of the plurality of pixels and the value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels,

wherein the first image signal of each of the plurality of pixels is obtained while T>

{C×

Vp/Id} is satisfied, where T is an accumulation time, C is a capacitance of the photoelectric conversion element, Vp is a voltage applied to the photoelectric conversion element.

14. A method of determining a defective pixel according to claim 6, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

22. A method of determining a defective pixel according to claim 6, wherein the pixel portion further has a thin film transistor.

30. A method of determining a defective pixel according to claim 6, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.

7. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

obtaining a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

reading a calibration sheet to obtain a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first difference between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first difference of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixel by obtaining a second difference between the first difference of the plurality of pixels and the value selected from a modal value, an average value and a maximum value of the first difference of the plurality of pixels,

wherein the first image signal of each of the plurality of pixels is obtained while an accumulation time of the photoelectric conversion element is 0.

15. A method of determining a defective pixel according to claim 7, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

23. A method of determining a defective pixel according to claim 7, wherein the pixel portion further has a thin film transistor.

31. A method of determining a defective pixel according to claim 7, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.

8. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

obtaining a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

reading a calibration sheet to obtain a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first ratio between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixel by obtaining a second ratio between the first ratio of the plurality of pixels and the value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels,

wherein the first image signal of each of the plurality of pixels is obtained while an accumulation time of the photoelectric conversion element is 0.

16. A method of determining a defective pixel according to claim 8, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

24. A method of determining a defective pixel according to claim 8, wherein the pixel portion further has a thin film transistor.

32. A method of determining a defective pixel according to claim 8, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.

9. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

obtaining a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

obtaining a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first difference between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first difference of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixel by obtaining a second difference between the first difference of the plurality of pixels and the value selected from a modal value, an average value and a maximum value of the first difference of the plurality of pixels,

wherein the first image signal of each of the plurality of pixels is obtained while T>

{C×

Vp/Id} is satisfied, where T is an accumulation time, C is a capacitance of the photoelectric conversion element, Vp is a voltage applied to the photoelectric conversion element, and

wherein the second image signal of each of the plurality of pixels is obtained while an accumulation time of the photoelectric conversion element is 0.

17. A method of determining a defective pixel according to claim 9, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

25. A method of determining a defective pixel according to claim 9, wherein the pixel portion further has a thin film transistor.

33. A method of determining a defective pixel according to claim 9, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.

10. A method of determining a defective pixel in a pixel portion, the pixel portion having a plurality of pixels each comprising a photoelectric conversion element and a display element, comprising the steps of:

obtaining a first image signal of each of the plurality of pixels by using the photoelectric conversion element;

obtaining a second image signal of each of the plurality of pixels by using the photoelectric conversion element;

calculating a first ratio between the first and second image signals of each of the plurality of pixels;

obtaining at least a value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels; and

determining whether each of the plurality of pixels is a defective pixel by obtaining a second ratio between the first ratio of the plurality of pixels and the value selected from a modal value, an average value and a maximum value of the first ratio of the plurality of pixels,

wherein the first image signal of each of the plurality of pixels is obtained while T>

{C×

Vp/Id} is satisfied, where T is an accumulation time, C is a capacitance of the photoelectric conversion element, Vp is a voltage applied to the photoelectric conversion element, and

wherein the second image signal of each of the plurality of pixels is obtained while an accumulation time of the photoelectric conversion element is 0.

18. A method of determining a defective pixel according to claim 10, wherein the photoelectric conversion element is an element selected from the group consisting of a PN photodiode, a PIN photodiode, an avalanche diode, an npn embedded diode, a Schottky diode, a phototransistor, an x-ray photoconductor, and an infrared sensor.

26. A method of determining a defective pixel according to claim 10, wherein the pixel portion further has a thin film transistor.

34. A method of determining a defective pixel according to claim 10, wherein the pixel portion is used in an electronic equipment selected from the group of a hand scanner, a video camera, a digital still camera, a notebook computer, a mobile computer, a cellular phone, a portable game machine and an electronic book.