Method for Switching Decoupled Plasma Nitridation Processes of Different Doses
First Claim
1. A method for switching decoupled plasma nitridation processes of different doses, comprising:
- (a) inserting a wafer into a chamber to perform a complete decoupled plasma nitridation process of a first dose on the wafer;
(b) removing the wafer from the chamber;
(c) inserting a dummy wafer into the chamber;
(d) inserting a process gas and RF power to the chamber, and performing a decoupled plasma nitridation doping process of a second dose on the dummy wafer;
(e) removing the dummy wafer from the chamber; and
(f) inserting another wafer to perform a complete decoupled plasma nitridation process of the second dose on the wafer.
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Abstract
A method for switching decoupled plasma nitridation (DPN) processes of different doses, which is able to decrease the switching time, is provided. According to the method, a dummy wafer is inserted into a chamber, a process gas introduced is ignited into plasma, and then a DPN doping process of the next dose is performed on the dummy wafer. The nitrogen concentration of the chamber is thus adjusted rapidly to switch to the DPN process of the next dose. In addition, after several cycles of the above steps are repeated, a dummy wafer is inserted into the chamber, and a complete DPN process of the next dose is performed on the dummy wafer. This process is performed several times before switching to the next DPN process.
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Citations
17 Claims
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1. A method for switching decoupled plasma nitridation processes of different doses, comprising:
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(a) inserting a wafer into a chamber to perform a complete decoupled plasma nitridation process of a first dose on the wafer;
(b) removing the wafer from the chamber;
(c) inserting a dummy wafer into the chamber;
(d) inserting a process gas and RF power to the chamber, and performing a decoupled plasma nitridation doping process of a second dose on the dummy wafer;
(e) removing the dummy wafer from the chamber; and
(f) inserting another wafer to perform a complete decoupled plasma nitridation process of the second dose on the wafer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method for switching from a low dose decoupled plasma nitridation process to a high dose decoupled plasma nitridation process, comprising:
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(a) inserting a wafer into a chamber to perform a complete low dose decoupled plasma nitridation process on the wafer;
(b) removing the wafer from the chamber;
(c) inserting a dummy wafer into the chamber;
(d) performing a high dose decoupled plasma nitridation doping process on the dummy wafer;
(e) removing the dummy wafer from the chamber; and
(f) inserting another wafer to perform a high dose complete decoupled plasma nitridation process on the wafer. - View Dependent Claims (13, 14, 15, 16, 17)
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Specification