Method for monitoring film thickness using heterodyne reflectometry and grating interferometry

• US 20060285120A1
• Filed: 07/10/2005
• Published: 12/21/2006
• Est. Priority Date: 02/25/2005
• Status: Abandoned Application

• Current Assignee: Verity Instruments Incorporated
• Original Assignee: Verity Instruments Incorporated
• Inventors: Aiyer, Arun Ananth
• Application Number:
  US11/178,856
• Publication Number:
  US 20060285120A1
• Time in Patent Office: Days
• US Class Current: 356/503
• CPC Class Codes: G01B 11/0625 with measurement of absorption or reflection
• CPC Class Codes: G01B 11/0641 with measurement of polarization

Abstract

A linearly polarized light comprised of two linearly polarized components, orthogonal to each other and with split optical frequencies, is directed toward a film. A detector receives the beam prior to incidence on the film layer and generates a reference signal. The reflected beam is diffracted into zeroth- and first-order bands, which are then detected by separate detectors; a measurement signal is generated from the zeroth-order beam and a grating signal from the first-order beam. The zeroth-order beam'"'"'s measurement signal and reference signal are analyzed by a phase detector for a heterodyne phase shift, and an accurate film thickness calculated from this phase shift by knowing a refractive index for the film. Additionally, the zeroth-order beam measurement signal is analyzed with the grating signal by a phase detector for detecting a grating phase shift induced by the grating. The refractive index for the film can then be calculated directly from grating phase shift and the heterodyne phase shift for the grating pitch, and the beam'"'"'s wavelength and incidence angle on the film of the measurement apparatus. Using the refractive index and heterodyne phase shift, the film'"'"'s thickness is determined for the apparatus. Conversely, the thickness of the film can be calculated independent of the refractive index, and without knowing the film'"'"'s refractive index, directly from the grating phase shift and the heterodyne phase shift for the apparatus.

Claims

1. A method for measuring a thickness parameter comprising:

directing an optical light source for producing a split frequency, dual polarized beam toward a target at a predetermined angle of incidence, said split frequency, dual polarized beam having a first polarized beam component oscillating at a first frequency and a second polarized beam component oscillating at a second frequency, the first frequency being unique from the second frequency, said target comprising a surface and a body;

generating a reference signal by heterodyning the first polarized beam component oscillating at the first frequency and the second polarized beam component oscillating at the second frequency;

receiving a reflected split frequency, dual polarized beam from the target;

diffracting the reflected split frequency, dual polarized beam as a zeroth-order beam and a first-order beam, said zeroth-order beam comprises a first zeroth-order polarized beam component and a second zeroth-order polarized beam component, and said first-order beam comprises a first first-order polarized beam component and a second first-order polarized beam component;

receiving the zeroth-order beam;

generating a measurement signal by heterodyning the first zeroth-order polarized beam component and the second zeroth-order polarized beam component;

detecting a measurement phase shift between said measurement and reference signals;

receiving the first-order beam;

generating a grating signal by heterodyning the first first-order polarized beam component and the second first-order polarized beam component;

detecting a grating induced phase shift between said grating and measurement signals; and

calculating a thickness of the target body from the grating induced phase shift and the measurement phase shift.

2. The method recited in claim 1, wherein calculating the thickness of the target body further comprises, finding a product of the grating induced phase shift and the measurement phase shift, wherein the thickness of the target is proportional to the product of the grating induced phase shift and the measurement phase shift.

3. The method recited in claim 1, wherein diffracting the reflected split frequency, dual polarized beam further comprises diffracting the beam through a grating having a predetermined pitch.

4. The method recited in claim 3, wherein calculating the thickness of the target body further comprises, finding a product of the grating induced phase shift, the measurement phase shift, the pitch and the first frequency, wherein the thickness is proportional to a product of the grating induced phase shift, the measurement phase shift, the pitch and the first frequency.

5. The method recited in claim 4, wherein calculating the thickness of the target body further comprises,

determining a numerator by finding a product of the grating induced phase shift, the measurement phase shift, the pitch and the first wavelengths;

determining a denominator by finding a product of the sine of a predetermined angle of incidence, a cosine of the predetermined angle of incidence, and a constant, wherein the constant is a product of the irrational number pi raised to a second power and an integer value of sixteen;

determining a quotient of the numerator and denominator; and

determining a square root of the quotient.

6. The method recited in claim 1, wherein the first polarization component is a first elliptical polarized beam component and the second polarization component is a second elliptical polarized beam component.

7. The method recited in claim 1, wherein the first polarization component is a first linearly polarized beam component and the second polarization component is a second linearly polarized beam component.

8. The method recited in claim 1, wherein the first polarization component is an s-polarized beam component and the second polarization component is a p-polarized beam component, wherein the p-polarized beam component is orthogonal to the s-polarized beam component.

9. The method recited in claim 1, wherein the target is a film.

10. The method recited in claim 1, wherein the predetermined angle of incidence is related to a refractive index for the target.

11. The method recited in claim 1, wherein the predetermined angle of incidence is a predetermined default angle.

12. The method recited in claim 11, wherein the predetermined default angle is approximately 60 degrees.

13. The method recited in claim 1, wherein the predetermined angle of incidence approximates Brewster'"'"'s angle for the target.

14. The method recited in claim 1, wherein a lower extent of the predetermined angle of incidence is 0 degrees based on one of the target body and an interface below the surface of the target being anisotropic for the split frequency, dual polarized beam.

15. The method recited in claim 1, further comprising:

mixing a reflected first polarization at the first frequency and a reflected second polarization at the second frequency of the reflected split frequency, dual polarized beam.

16. The method recited in claim 1 further comprises:

producing a corrected grating induced phase shift by correcting error in the grating induced phase shift based on a comparison between an actual phase shift for known refractive index and an expected phase shift for the known refractive index; and

calculating an error corrected thickness from the corrected grating induced phase shift and the corrected phase shift.

17. The method recited in claim 16 further comprises:

calculating a refractive index for the target from the corrected grating induced phase shift and the corrected phase shift; and

calculating an error corrected thickness from the refractive index and the corrected phase shift.

18. The method recited in claim 1, further comprising:

generating a second measurement signal by heterodyning a first reflected polarized beam component oscillating at the first frequency reflected from the target and a second reflected polarized beam component oscillating at the second frequency reflected from the target;

detecting a phase shift between the second reference signal and the second measurement signal, said phase shift being induced by a thickness of said target body; and

calculating a second thickness of the target body from the phase shift.

19. The method recited in claim 18, wherein correcting error in the phase shift further comprises:

producing a corrected phase shift by adjusting the phase shift based on a comparison of a difference between an actual phase shift for known thickness and an expected phase shift for the known thickness.

20. The method recited in claim 19, further comprises:

comparing the first thickness of the target with the thickness of the target, calculated from the grating induced phase shift and the measurement phase shift, with the second thickness of the target, calculated from the second measurement phase shift.

21. The method recited in claim 16 further comprises:

calculating an error corrected thickness from the corrected grating induced phase shift and the corrected phase shift.