Spectral filter system for infrared imaging of substrates through coatings

• US 20060289766A1
• Filed: 08/18/2006
• Published: 12/28/2006
• Est. Priority Date: 10/22/2004
• Status: Active Grant

• Current Assignee: Northrop Grumman Systems Corporation (Northrop Grumman Corporation)
• Original Assignee: Northrop Grumman Corporation
• Inventors: Chu, Steven, DiMarzio, Donald, Weir, John Douglas, Leyble, Dennis John, Fonneland, Nils Jakob
• Granted Patent: US 7,462,809 B2
• Time in Patent Office: Days
• US Class Current: 250/341.800
• CPC Class Codes: G01J 2005/0077 Imaging
• CPC Class Codes: G01N 2021/8472 Investigation of composite materials
• CPC Class Codes: G01N 21/35 using infrared light G01N21/39 takes precedence
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/8422 Investigating thin films, e.g. matrix isolation method
• CPC Class Codes: G01N 21/88 Investigating the presence of flaws or contamination
• CPC Class Codes: G01N 25/72 Investigating presence of flaws

Abstract

An improved system for visual inspection of substrates coated with paints and polymers is disclosed. Painted substrates can be inspected for environmental and physical damage such as corrosion and cracks without removing the paint. The present invention provides the ability to maximize paint thickness penetration. This is accomplished with a spectral bandpass filter that rejects reflected light from the coating opaque bands, while allowing light in the paint window to pass to an IR detector such as an IR camera focal plane. The narrow bandpass range enhances the ability for IR imaging to see through thicker paint layers and improves the contrast over standard commercial IR mid-wave cameras. The bandpass may be adjusted to coincide with the full spectral window of the paint, consistent with the ability of the imaging focal plane to detect light in the spectral region.

Claims

1. A system for imaging the surface of a substrate through a coating on the substrate, comprising:

a detector positioned to receive infrared radiation from the substrate surface; and

at least one narrow bandwidth spectral optical filter between the substrate and the detector to pass infrared wavelengths from 3.75 to 5.0 micrometers to the detector.

2. The system of claim 1, wherein the infrared radiation from the substrate comprises blackbody radiation from the substrate.

3. The system of claim 1, wherein the infrared radiation from the substrate comprises reflected infrared radiation from the substrate.

4. The system of claim 1, further comprising a source of infrared radiation illuminating the substrate.

5. The system of claim 1, wherein the detector comprises an infrared camera.

7. The system of claim 1, wherein the structural features comprise defects.

8. The system of claim 1, wherein the object comprises an aircraft component.

9. The system of claim 1, wherein the coating has a thickness of 0.5 to 12 mils.

10. The system of claim 1, wherein the coating comprises paint, a composite matrix material, primer, top coat and/or intermediate coatings.

11. The system of claim 1, further comprising means for displaying an image of the object including the detected structural features.

12. The system of claim 1, further comprising means for comparing an image of the object including the detected structural features with a reference image.

13. The method of claim 12, wherein the reference image is generated from another object similar to the coated object that is substantially free of defects.

14. The system of claim 1, further comprising means for comparing an image of the object where the filter may be selected to maximize signal-to-noise ratio and contrast between reflective surfaces through a coating.

6. The system of claim 6, wherein the infrared camera detects mid-infrared radiation having wavelengths between about 3 and about 5 microns.

15. A method for imaging the surface of a substrate through a coating on the substrate, comprising:

generating infrared light from the substrate;

filtering the infrared light with a narrow bandwidth filter which passes wavelengths within a range of from 3.75 to 5.0 micrometers; and

receiving the filtered infrared light on a detector.

16. The method of claim 15, wherein the infrared radiation from the substrate comprises blackbody radiation from the substrate.

17. The method of claim 15, wherein the infrared radiation from the substrate comprises reflected infrared radiation from the substrate.

18. The method of claim 15, further comprising illuminating the substrate with infrared radiation.

19. The method of claim 15, wherein the coating has a thickness not to exceed 12 mils.

20. The method of claim 15, further comprising generating at least one image from the detector so as to visually reveal structural features of the substrate.

22. The device as claimed in claim 19, wherein the waveguide comprises two waveguide parts which enclose the component when said two waveguide parts are assembled.

23. The device as claimed in claim 19, comprising a static magnet whose field line inside the waveguide are oriented in the z direction.

24. The device as claimed in claim 19, wherein the waveguide comprises two waveguide parts which enclose the component when when said two waveguide parts are assembled and the magnetic field line are guided via the sides of one of the two waveguide parts into the adhesive joint.