Inspection system with material identification

• US 20060291622A1
• Filed: 06/14/2006
• Published: 12/28/2006
• Est. Priority Date: 06/14/2005
• Status: Active Grant

• Current Assignee: L-3 Communications Security and Detection Systems Incorporated
• Original Assignee: L-3 Communications Security & Detection Systems, Inc. (Leidos Holdings, Inc.)
• Inventors: Smith, Richard C., Connelly, James M., Madden, Robert W.
• Granted Patent: US 7,653,176 B2
• Time in Patent Office: Days
• US Class Current: 378/69
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01V 5/0016 Active interrogation, i.e. using an external radiation source, e.g. using pulsed, continuous or cosmic rays
• CPC Class Codes: G01V 5/0025 Measuring scattered radiation
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G21K 1/02 using diaphragms, collimators

Abstract

An angular analysis system that can be controlled to receive radiation at a defined angle from a defined focus region. The angular analysis system is used for level 2 inspection in an explosive detection system. Level 2 inspection is provided by a three-dimensional inspection system that identifies suspicious regions of items under inspection. The angular analysis system is focused to gather radiation scattered at defined angles from the suspicious regions. Focusing may be achieved in multiple dimensions by movement of source and detector assemblies in a plane parallel to a plane holding the item under inspection. Focusing is achieved by independent motion of the source and detector assemblies. This focusing arrangement provides a compact device, providing simple, low cost and accurate operation.

Claims

1. An inspection system, comprising:

a) a conveyor adapted to move items in a first direction;

b) a source assembly comprising;

i) an x-ray source adapted to irradiate an item on the conveyor; and

ii) a source collimator positioned between the x-ray source and the conveyor;

c) a first positioning mechanism adapted and arranged to move the source assembly in a second direction, transverse to the first direction;

d) a detector assembly comprising;

i) a detector; and

ii) a detector collimator positioned between the detector and the conveyor; and

e) a second positioning mechanism adapted and arranged to move the detector assembly in the second direction, the second positioning mechanism adapted and arranged to be controlled in at least one direction independently of the first positioning mechanism.

2. The inspection system of claim 1, wherein the first positioning mechanism is adapted and arranged to move the source in the first direction and the second positioning mechanism is adapted and arranged to the move the detector in the first direction.

3. The inspection system of claim 1, wherein the source collimator is shaped to pass a pencil beam of radiation and the detector collimator is shaped to receive a fan beam of radiation from an incident angle.

4. The inspection system of claim 3, further comprising a controller coupled to the detector collimator and adapted to vary the incident angle.

5. The inspection system of claim 1, wherein the detector collimator comprises a movable stage carrying a plate having a plurality of apertures therein.

6. The inspection system of claim 5, wherein the plurality of apertures comprises a pinhole, a slit and an aperture having an x-ray fluorescent member disposed therein.

7. The inspection system of claim 1, wherein the x-ray source has an energy below about 120 keV.

8. The inspection system of claim 1, wherein the first positioning mechanism is constrained to position the source assembly in a first plane parallel to the first direction and the second positioning mechanism is constrained to position the detector assembly in a second plane parallel to the first plane.

9. A method of operating an inspection system having:

a) an inspection region adapted and arranged to position an item under inspection in a plane;

b) a source; and

c) a detector;

the method comprising;

i. moving the source and the detector parallel to the plane to create a focus region in an item under inspection;

ii. with the source, radiating a portion of the item under inspection, the portion including the focus region;

iii. with the detector, measuring radiation emanating at an angle from the focus region; and

iv. analyzing the measured radiation.

10. The method of claim 9, further comprising dithering the position of the source and detector while measuring radiation.

11. The method of claim 9, further comprising aligning the detector relative to the source by measuring with the detector radiation passing through a pinhole collimator.

12. The method of claim 9, wherein moving the source and the detector comprises positioning the source and detector with a separation in a first direction.

13. The method of claim 12, wherein measuring comprises measuring radiation passing through a detector collimator, the detector collimator comprising at least one aperture shaped as a slit, the slit having a narrow dimension in the first direction.

14. A method of operating an inspection system, the method comprising:

a) moving an item through an inspection area; and

b) gathering data on a focus region of the item using a source and a detector while moving the source and the detector synchronously with the item.

15. The method of claim 14, further comprising:

c) moving the source and detector other than synchronously with the item, whereby the source and detector are aligned with a second focus region of the item; and

d) subsequently gathering data on the second focus region of the item using the source and detector while moving the source and the detector synchronously with the item.

16. The method of claim 14, wherein moving an item comprises moving the item through the inspection area in a first direction and moving the source and detector other than synchronously with the item comprises moving the source and detector transverse to the first direction.

17. The method of claim 15, wherein moving the source and detector other than synchronously with the item comprises moving the source and detector different amounts.

18. The method of claim 14, wherein the inspection area is in a second inspection device and the method further comprises, prior to moving the item through the inspection area in the second inspection device, identifying the focus region in a first inspection device.

19. The method of claim 18, wherein the first inspection device and the second inspection device are coupled through a conveyor system and moving the item comprises moving the item on the conveyor system through the first inspection device and the second inspection device without stopping.

20. The method of claim 19, wherein the first inspection device inspects a series of items of which a plurality of items are identified for further inspection in the second device, items in the plurality are identified at a rate and the second inspection device inspects items at least the rate.