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Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle

  • US 20060291714A1
  • Filed: 12/07/2004
  • Published: 12/28/2006
  • Est. Priority Date: 12/07/2004
  • Status: Active Grant
First Claim
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1. A computer-implemented method for sorting defects in a design pattern of a reticle, comprising:

  • searching for defects of interest in inspection data using priority information and defect attributes associated with individual defects in combination with one or more characteristics of a region proximate the individual defects and one or more characteristics of the individual defects, wherein the inspection data is generated by comparing images of the reticle generated for different values of a lithographic variable, and wherein the images comprise at least one reference image and at least one modulated image; and

    assigning one or more identifiers to the defects of interest.

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