Method for the preferred processing of workpieces of highest priority

• US 20070005170A1
• Filed: 06/29/2005
• Published: 01/04/2007
• Est. Priority Date: 06/29/2005
• Status: Abandoned Application

• Current Assignee: Infineon Technologies AG
• Original Assignee: Infineon Technologies AG
• Inventors: Schedel, Thorsten
• Application Number:
  US11/170,191
• Publication Number:
  US 20070005170A1
• Time in Patent Office: Days
• US Class Current: 700/101
• CPC Class Codes: G05B 19/41865 characterised by job scheduling, process planning, material flow
• CPC Class Codes: G05B 2219/32266 Priority orders
• CPC Class Codes: G05B 2219/32298 Designate at least two group of articles, first with priority, reschedule second
• CPC Class Codes: Y02P 90/02 Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

A method is provided for the preferred processing of a workpiece of highest priority in a plant with a number of processing steps and at least one processing station for each processing step. A workpiece of highest priority to be added is inserted at the head of the line before the first processing step and is passed to the next processing station of this processing step that becomes free. For each subsequent processing step, a processing station of this processing step is kept free or preallocated. In the event that there are a number of processing stations for a processing step, the one which experiences the shortest standstill time on account of being kept free or at which the workpiece of highest priority experiences the shortest waiting time on account of it being preallocated being selected from among these processing stations. The workpiece of highest priority is passed on to the processing station kept free or preallocated and is once again inserted at the head of the line.

Claims

1. A method for the preferred processing of a workpiece of highest priority in plants with a number of processing steps and at least one processing station for each processing step, each workpiece running through a number of processing steps, each workpiece being assigned a priority, the workpieces being arranged in a line ordered according to their priority and, after the end of one processing step, each workpiece being passed for the performance of the next processing step to the next processing station becoming free, the method comprising:

inserting a workpiece of highest priority at the head of the line before the first processing step and passing said workpiece of highest priority to the next processing station of this processing step that becomes free,

for each subsequent processing step;

preallocating or keeping free a processing station of that processing step, wherein, in the event that there are a number of processing stations for that processing step, the one which experiences the shortest standstill time on account of being kept free or at which the workpiece of highest priority experiences the shortest waiting time on account of it being preallocated being selected from among these processing stations; and

passing the workpiece of highest priority on to the processing station kept free or preallocated and inserting the workpiece of highest priority at the head of the line, such that, after its arrival at the processing station kept free or preallocated, the workpiece of highest priority can be processed immediately or after a short waiting time.

2. The method of claim 1, wherein the workpieces comprise semiconductor wafers and wherein the processing steps comprise semiconductor processing steps.

3. A method for the preferred processing of a workpiece of highest priority in plants with a number of processing steps and at least one processing station for each processing step, each workpiece running through a number of processing steps, each workpiece being assigned a priority, the workpieces being arranged in a line ordered according to their priority and, after the end of one processing step, each workpiece being passed for the performance of the next processing step to the next processing station becoming free, comprising the method, at predeterminable intervals,

calculating a time t_Am of its possible arrival at each processing station m of the next processing step for the workpiece of highest priority;

calculating a time t_m,n of the end of processing each workpiece, where n=1 . . . N+1 of the line for each existing processing station and m=1 . . . M of the next processing step;

calculating a difference D_m,n=t_Am−

t_m,n until D_m/N+1 assumes a negative value, where n=1 refers to the workpiece currently being processed and where N refers to the number of workpieces for which the processing step the processing station m can be completed before the arrival of the workpiece of highest priority;

selecting a processing station m of the next processing step that has the smallest non-negative value of D_m,N if at least one non-negative D_m,N exists; and

selecting the processing station of the next processing step that has the smallest absolute value of D_m,N if no non-negative D_m,N exists.

4. The method as claimed in claim 3, in which, in the calculation of the times t_Am and t_m,n, current information on an expected end of the respective processing step is taken into account.

5. The method as claimed in claim 4, wherein the current information is estimated directly before the calculation of t_Am and t_m,n on the basis of a remaining processing time in the respective processing step, the remaining processing time being dependent on the size and number of the workpieces currently being processed.

6. The method as claimed in claim 4, wherein the current information is estimated directly before the calculation of t_Am and t_m,n on the basis of a time requirement for special processing steps.

7. The method as claimed in claim 4, wherein the current information is estimated directly before the calculation of t_Am and t_m,n on the basis of technologically caused waiting times.

8. The method as claimed in claim 4, wherein the current information is estimated directly before the calculation of t_Am and t_m,n on the basis of manual or automatic interruptions.

9. The method as claimed in claim 4, wherein the current information is estimated directly before the calculation of t_Am and t_m,n on the basis of planned and unplanned downtimes of the respective processing station on account of servicing work, power failures or breakdowns.

10. The method of claim 3, wherein the workpieces comprise semiconductor wafers and wherein the processing steps comprise semiconductor processing steps.

11. A method for the preferred processing of a workpiece of highest priority in plants with a number of processing steps and at least one processing station for each processing step, each workpiece running through a number of processing steps, each workpiece being assigned a priority, the workpieces being arranged in a line ordered according to their priority and, after the end of one processing step, each workpiece being passed for the performance of the next processing step to the next processing station becoming free, in which method at least one further processing station of the same processing step is selected and kept free or preallocated, the processing station that experiences a shortest standstill time on account of being kept free or at which the workpiece of highest priority experiences the shortest waiting time on account of it being preallocated being selected from among the not yet selected processing stations.

12. The method of claim 11, wherein the workpieces comprise semiconductor wafers and wherein the processing steps comprise semiconductor processing steps.

13. A method for the preferred processing of a workpiece of highest priority in plants with a number of processing steps and at least one processing station for each processing step, each workpiece running through a number of processing steps, each workpiece being assigned a priority, the workpieces being arranged in a line ordered according to their priority and, after the end of one processing step, each workpiece being passed for the performance of the next processing step to the next processing station becoming free, in which method, for all the selected processing stations, the standstill times of the processing station or the waiting times of the workpieces of highest priority are recorded and stored for evaluation purposes.

14. The method of claim 13, wherein the workpieces comprise semiconductor wafers and wherein the processing steps comprise semiconductor processing steps.