Methods and apparatus using a hierarchical test development tree to specify devices and their test setups

• US 20070006038A1
• Filed: 06/29/2005
• Published: 01/04/2007
• Est. Priority Date: 06/29/2005
• Status: Abandoned Application

• Current Assignee: Verigy Limited (Advantest Corporation)
• Original Assignee: Verigy Limited (Advantest Corporation)
• Inventors: Zhou, Zhengrong
• Application Number:
  US11/170,374
• Publication Number:
  US 20070006038A1
• Time in Patent Office: Days
• US Class Current: 714/38
• CPC Class Codes: G01R 31/318314 Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages simulation software G01R31/318357; emulators G06F11/261
• CPC Class Codes: G06F 11/263 Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Abstract

In one embodiment, a computer program is provided with code to display a hierarchical test development tree within a GUI of an automated test development environment. The tree has a node to which device branches corresponding to DUTs are added. The computer program is also provided with code to automatically associate a pin configuration branch and a test setups branch with each device branch; and code to, in response to user interaction with branches of the tree, display a number of windows for specifying the DUTs and their test setups. Other embodiments are also disclosed.

Claims

1. A computer program, comprising:

code to display a hierarchical test development tree within a graphical user interface (GUI) of an automated test development environment, the tree comprising a node to which device branches corresponding to devices under test (DUTs) are added;

code to automatically associate a pin configuration branch and a test setups branch with each device branch; and

code to, in response to user interaction with branches of the tree, display a number of windows for specifying the DUTs and their test setups.

2. The computer program of claim 1, wherein all test setups of the DUTs are accessible via the tree.

3. The computer program of claim 1, further comprising:

code to, upon a predetermined interaction with the tree, display a dropdown menu providing access to a device creation option.

4. The computer program of claim 3, further comprising:

code to, upon user selection of the device creation option, display an interface for specifying a path, name and technology of a DUT.

5. The computer program of claim 1, further comprising:

code to, upon a predetermined interaction with a device branch, display a dropdown menu providing access to i) an option for hiding the device branch, and ii) a device properties option.

6. The computer program of claim 5, wherein the predetermined interaction is a mouse-click.

7. The computer program of claim 1, further comprising:

code to, upon a hover interaction with a device branch, display a device path for the DUT associated with the device branch.

8. The computer program of claim 1, further comprising:

code to, upon a predetermined interaction with a pin configuration branch, display a dropdown menu providing access to a pin configuration import option.

9. The computer program of claim 8, wherein the predetermined interaction is a mouse-click.

10. The computer program of claim 1, wherein multi-site pin information is directly displayed in the tree, in conjunction with each pin configuration branch.

11. The computer program of claim 1, further comprising:

code to, upon a predetermined interaction with a pin configuration branch, display a dropdown menu providing access to pin group viewing options.

12. The computer program of claim 11, wherein the pin group viewing options provide for viewing all analog pins, all RF pins, and all digital pins.

13. The computer program of claim 1, further comprising:

code to, upon a predetermined interaction with a test setups branch, display options for developing new test setups.

14. The computer program of claim 13, wherein the options for developing new test setups comprise options for developing analog, RF and digital test setups.

15. The computer program of claim 13, wherein the options for developing new test setups comprise an option for developing a vector label, the computer program further comprising:

code to, upon selection of the option for developing a vector label, display a vector pattern editor window for specifying the vector label, including a default or custom pattern timing; and

code to, upon selection of a custom pattern timing, display a timing editor window.

16. The computer program of claim 1, wherein the test setups branch of a device comprises sub-branches corresponding to the device'"'"'s test setups, the computer program further comprising:

code to, upon a hover interaction with one of the sub-branches, display a summary of the corresponding test setup.

17. The computer program of claim 1, further comprising:

code to group a device'"'"'s test setups under sub-branches of the device'"'"'s test setups branch, the sub-branches comprising i) an RF &

Analog test setups branch, and ii) a digital test setups branch.

18. The computer program of claim 17, further comprising:

code to group a device'"'"'s RF &

Analog test setups under stimulus and measurement sub-branches.

19. The computer program of claim 17, further comprising:

code to group a device'"'"'s RF &

Analog test setups under stimulus singleton, measurement singleton, and stimulus and measurement group sub-branches.

20. The computer program of claim 17, further comprising:

code to group a device'"'"'s digital test setups under digital built-in self-test (BIST) and digital test pattern sub-branches.

21. The computer program of claim 17, wherein the sub-branches further comprise a complex test setups branch, wherein complex test setups combine digital test patterns with analog or RF test setups.

22. A computer program, comprising:

code to display a graphical user interface (GUI) of an automated test development environment;

code to display a number of collapsible windows within the GUI, the collapsible windows containing icons for accessing automated test development tools;

code to, in response to user selection of one of the icons, display a hierarchical test development tree within the GUI, the tree comprising a node to which device branches corresponding to devices under test (DUTs) are added; and

code to, in response to user interaction with branches of the tree, display a number of windows for specifying the devices and their test setups.

23. The computer program of claim 22, wherein the automated test development tools comprise a pin configuration tool, a test setup editor, and a testflow editor.

24. The computer program of claim 22, wherein all test setups of the DUTs are accessible via the tree.

25. The computer program of claim 22, further comprising:

code to display a test setups branch corresponding to each device branch;

code to, upon a predetermined interaction with a test setups branch, display options for specifying new analog &

RF test setups; and

code to, upon selection of one of the options for developing new analog &

RF test setups, display a number of interface windows for specifying the selected new test setup.

26. The computer program of claim 22, further comprising:

code to display a test setups branch corresponding to each device branch;

code to, upon a predetermined interaction with a test setups branch, display an option for specifying a vector label;

code to, upon selection of the option for specifying the vector label, display a digital pattern editor window for specifying the vector label, including a default or custom pattern timing; and

code to, upon selection of a custom pattern timing, display a timing editor window.

27. A method for developing tests for automated test equipment, comprising:

initiating a predetermined interaction with a hierarchical test development tree displayed within a graphical user interface (GUI) of an automated test development environment, the tree providing access to devices under test (DUTs) and DUT test setups; and

upon initiating the predetermined interaction, providing input to a number of displayed windows to specify a test setup for one of the DUTs.