Semiconductor device and test method of semiconductor device
First Claim
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1. A semiconductor device, comprising:
- a function unit portion including a circuit element;
a non-volatile memory portion in which rank data are stored, the rank data presenting results of a rank-classification test on the circuit element, the rank-classification test on the circuit element being performed on the basis of a plurality of test criteria on wafer state; and
a control portion reading out the rank data from the non-volatile memory portion, the control portion being used in a product test after packaging.
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Abstract
There is provided a semiconductor device comprising, a function unit portion including a circuit element, rank data presenting results of a rank-classification test on the circuit element, the rank-classification test being performed on the basis of a plurality of test criteria on wafer state, a non-volatile memory portion in which the rank data are stored, and a control portion reading out the rank data from the non-volatile memory portion, the control portion being used in a product test after packaging.
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Citations
17 Claims
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1. A semiconductor device, comprising:
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a function unit portion including a circuit element;
a non-volatile memory portion in which rank data are stored, the rank data presenting results of a rank-classification test on the circuit element, the rank-classification test on the circuit element being performed on the basis of a plurality of test criteria on wafer state; and
a control portion reading out the rank data from the non-volatile memory portion, the control portion being used in a product test after packaging. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A test method of a semiconductor device, comprising:
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performing a rank-classification test on a circuit element included in a chip portion on wafer state on the basis of a plurality of test criteria; and
writing results of the rank-classification test as rank data into the non-volatile memory portion so that the rank data are stored in the non-volatile memory portion. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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Specification