×

Test pattern compression for an integrated circuit test environment

  • US 20070016836A1
  • Filed: 09/18/2006
  • Published: 01/18/2007
  • Est. Priority Date: 11/23/1999
  • Status: Active Grant
First Claim
Patent Images

1-30. -30. (canceled)

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×