Dual BGA alloy structure for improved board-level reliability performance

• US 20070023910A1
• Filed: 07/29/2005
• Published: 02/01/2007
• Est. Priority Date: 07/29/2005
• Status: Abandoned Application

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Beddingfield, Stanley
• Application Number:
  US11/192,876
• Publication Number:
  US 20070023910A1
• Time in Patent Office: Days
• US Class Current: 257/738
• CPC Class Codes: H01L 2224/45015 being circular
• CPC Class Codes: H01L 2224/45099 Material
• CPC Class Codes: H01L 2224/48227 connecting the wire to a bond pad of the item
• CPC Class Codes: H01L 23/49816 Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
• CPC Class Codes: H01L 23/49866 characterised by the materials materials of the substrates H01L23/14, of the lead-frames H01L23/49579
• CPC Class Codes: H01L 24/48 of an individual wire connector
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/00012 Relevant to the scope of the group, the symbol of which is combined with the symbol of this group
• CPC Class Codes: H01L 2924/00014 the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
• CPC Class Codes: H01L 2924/01322 Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
• CPC Class Codes: H01L 2924/15311 being a ball array, e.g. BGA
• CPC Class Codes: H01L 2924/181 Encapsulation
• CPC Class Codes: H01L 2924/207 Diameter ranges

Abstract

A method of improving the performance of a ball grid array package under temperature cycling and drop tests is disclosed. The method comprises forming a ball grid array with two types of solder balls. The first type of ball has a composition that improves performance under temperature cycling and the second set of solder balls has a composition that improves performance under drop testing. Preferably, the first set of balls is under the die near its perimeter and the second set of balls is located near the package perimeter, particularly at corners. A related concept pertains to a semiconductor device comprising a printed circuit board and a ball grid array package attached to the printed circuit board by an array of solder balls. The solder ball array comprises first and second sets of solder balls, the two sets having distinctly different compositions.

Claims

1. A method of manufacturing a ball grid array package, comprising:

combining a die having a first area with a substrate to form a package having a second, larger area, whereby one side of the package has an area overlying the die, and a surrounding area overlying the substrate but not the die; and

forming a ball grid array of solder balls over the one side, wherein a first set of the solder balls overlies the die near its perimeter and a second set of solder balls proximate the perimeter of the package does not overly the die;

wherein the first set of solder balls has a first composition and the second set of solder balls has a second, distinctly different, composition.

2. The method of claim 1, wherein the solder balls are lead free.

3. The method of claim 1, wherein the first set of solder balls has a lower silver content than the second set of solder balls.

4. The method of claim 1, wherein the first set of solder balls has no more than about 0.3% silver and the second set of solder balls has at least about 2.0% silver.

5. The method of claim 1, wherein the substrate is organic.

6. The method of claim 1, further comprising wire bonding the die to conductive traces or vias in the substrate.

7. The method of claim 1, wherein the first and second sets of solder balls are reflowed in one reflow procedure.

8. The method of claim 1, wherein the ball grid array has a pitch of about 0.5 mm or less.

9. The method of claim 1, wherein:

the first set of solder balls is more elastic than the second set of solder balls; and

the second set of solder balls has greater ultimate tensile strength than the first set of solder balls.

10. The method of claim 1, wherein:

a ball grid array of solder balls having the first composition performs better under temperature cycle testing as compared to a ball grid array of solder balls having the second composition; and

a ball grid array of solder balls having the second composition performs better under drop testing as compared to a ball grid array of solder balls having the first composition

11. A semiconductor device, comprising:

a printed circuit board;

a ball grid array package attached to the printed circuit board by an array of solder balls;

wherein the array comprises a first set of solder balls and a second set of solder balls, the two sets of solder balls having distinctly different compositions.

12. The semiconductor device of claim 11, wherein the first set of solder balls underlies a die contained by the package, and the second set of solder balls underlies a substrate of the package, but not the die.

13. The semiconductor device of claim 11, wherein the ball grid array package is attached to the printed circuit board without underfill.

14. The semiconductor device of claim 11, wherein the solder balls are lead free.

15. The semiconductor device of claim 11, wherein the first set of solder balls has a lower silver content than the second set of solder balls.

16. The semiconductor device of claim 11, wherein the array has a pitch of about 0.5 mm or less.

17. The semiconductor device of claim 11, wherein:

the first set of solder balls is more elastic than the second set of solder balls; and

the second set of solder balls has greater ultimate tensile strength than the first set of solder balls.

18. The semiconductor device of claim 11, wherein the first and second sets of solder balls reflow at one temperature.

19. The semiconductor device of claim 11, wherein:

a ball grid array of solder balls having the composition of the first set of balls performs better under temperature cycle testing as compared to a ball grid array of solder balls having the composition of the second set of balls; and

a ball grid array of solder balls having the composition of the second set of balls performs better under drop testing as compared to a ball grid array of solder balls having the composition of the first set of balls

20. A method of improving the performance of a ball grid array package under temperature cycling and drop tests, comprising:

forming a first portion of a connection array for the ball grid array package using a first solder ball type; and

forming a second portion of the connection array using a second solder ball type;

wherein the first set of solder balls improves performance under drop testing and the second set of solder balls improves performance under temperature cycle testing, and the locations for the first and second solder ball types are selected to improve the overall ability of the ball grid array package to pass both temperature cycle and drop testing.