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Built in loop back self test in design or on test board for transceivers

  • US 20070026809A1
  • Filed: 07/26/2005
  • Published: 02/01/2007
  • Est. Priority Date: 07/26/2005
  • Status: Active Grant
First Claim
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1. A transceiver communication device comprising:

  • a transmitter configured to provide a transmitter output signal;

    a receiver configured to selectively receive a receiver input signal, wherein the receiver input signal has a predefined frequency and a predefined amplitude, wherein the predefined frequency is selectable over a range of receive frequencies and the predefined amplitude is selectable over a range of receive amplitudes; and

    a built in self test (BIST) circuit operable in a test mode to receive the transmitter output signal and provide the receiver input signal.

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