Built in loop back self test in design or on test board for transceivers

• US 20070026809A1
• Filed: 07/26/2005
• Published: 02/01/2007
• Est. Priority Date: 07/26/2005
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Zhang, Lianrui, Weinberger, Charles
• Granted Patent: US 7,477,875 B2
• Time in Patent Office: Days
• US Class Current: 455/67.110
• CPC Class Codes: H04B 17/0085 using test signal generators

Abstract

In a method and system for testing a transceiver communication device operating in a test mode, a transmitter output signal generated by a transmitter is adjusted and provided as a loop back to a receiver. The adjustment includes shifting a frequency and attenuating amplitude of the transmitter output signal to substantially match a predefined frequency and a predefined amplitude of a receiver input signal received by the receiver. A pass or fail status of the device is determined by comparing transmitted and received data.

Claims

1. A transceiver communication device comprising:

a transmitter configured to provide a transmitter output signal;

a receiver configured to selectively receive a receiver input signal, wherein the receiver input signal has a predefined frequency and a predefined amplitude, wherein the predefined frequency is selectable over a range of receive frequencies and the predefined amplitude is selectable over a range of receive amplitudes; and

a built in self test (BIST) circuit operable in a test mode to receive the transmitter output signal and provide the receiver input signal.

2. The device of claim 1, wherein the BIST circuit includes:

a frequency shift circuit operable to receive the transmitter output signal and provide a frequency shifted output signal having a frequency substantially matching the predefined frequency; and

an attenuator circuit operable to receive the frequency shifted output signal and provide the receiver input signal.

3. The device of claim 2, wherein the attenuator circuit adjusts an amplitude of the frequency shifted output signal to substantially match the predefined amplitude.

4. The device of claim 2, wherein the attenuator circuit is programmable to automatically adjust an output power of the transmitter output signal to substantially match a predefined input power of the receiver input signal.

5. The device of claim 2, wherein the frequency shift circuit is bypassed when a frequency of the transmitter output signal is substantially the same as the predefined frequency.

6. The device of claim 2, wherein the frequency shift circuit includes:

a frequency divider circuit operable to divide a frequency of an oscillator input signal by a predefined factor to provide a predefined local oscillator output signal; and

a mixer circuit operable to combine the transmitter output signal and the predefined local oscillator output signal to provide the frequency shifted output signal.

7. The device of claim 6, wherein the frequency shift circuit further includes:

a selector circuit operable to select one of the predefined local oscillator output signal or an external local oscillator signal, wherein the external local oscillator signal when combined with the transmitter output signal provides the frequency shifted output signal.

8. The device of claim 1, wherein the BIST circuit is activated in the test mode and bypassed in a normal operating mode.

9. The device of claim 1, wherein the device is included in a portable electronic device, wherein the portable electronic device is one of a personal communications device, a personal entertainment device, and a notebook computer or a combination thereof.

10. The device of claim 1, wherein the device is one of a microprocessor, a digital signal processor, a radio frequency integrated circuit, and a microcontroller.

11. The device of claim 1, wherein the transmitter output signal and the receiver input signal are communicated via a wireless media when the BIST circuit is bypassed in a normal operating mode.

12. The device of claim 1, wherein the device is tested without an external radio frequency test signal source.

13. The device of claim 1, wherein the BIST circuit is placed in the test mode in response to receiving a test mode input signal, wherein placing the BIST circuit in the test mode enables a plurality of switches to loop back the transmitter output signal provided by an output of the transmitter to an input of the receiver.

14. A test system comprising:

a tester to provide a plurality of test signals;

a device under test (DUT) to receive the plurality of test signals, wherein the DUT includes a transceiver for providing a transmitter output signal and for receiving a receiver input signal, wherein the receiver input signal has a selectable predefined frequency and a selectable predefined amplitude; and

a loop back circuit to receive the transmitter output signal and receive a local oscillator signal to provide the receiver input signal.

15. The system of claim 14, wherein the DUT is one of a microprocessor, a digital signal processor, a radio frequency integrated circuit, and a microcontroller.

16. The system of claim 14, wherein the loop back circuit includes:

a mixer operable to combine the transmitter output signal and the local oscillator signal to provide a frequency shifted output signal having a frequency substantially matching the selectable predefined frequency; and

an attenuator operable to receive the frequency shifted output signal and provide the receiver input signal.

17. The system of claim 14, comprising:

another device under test (ADUT) to receive the plurality of test signals, wherein the ADUT includes another transceiver for providing another transmitter output signal and for receiving another receiver input signal having another selectable predefined frequency and amplitude; and

another loop back circuit to receive the another transmitter output signal and the local oscillator signal to provide the another receiver input signal.

18. A method of testing a transceiver device having a transmitter and a receiver, the method comprising:

receiving an input to place the device in a test mode, wherein the test mode enables a loop back of a transmitter output signal to a receiver input signal;

converting the transmitter output signal to substantially match the receiver input signal having a predefined frequency and a predefined amplitude; and

providing the receiver input signal having the predefined frequency and the predefined amplitude to the receiver.

19. The method of claim 18, wherein the device is one of a microprocessor, a digital signal processor, a radio frequency integrated circuit, and a microcontroller.

20. The method of claim 18, wherein the converting comprises:

mixing the transmitter output signal with a local oscillator signal to provide the receiver input signal having the predefined frequency; and

attenuating the receiver input signal having the predefined frequency to provide the receiver input signal, wherein the receiver input signal has the predefined frequency and the predefined amplitude.