Method for inhibiting oxygen and moisture degradation of a device and the resulting device
First Claim
1. A method for for creating a gas/fluid barrier layer on a device, said method comprising the steps of:
- depositing a low liquidus temperature inorganic material over at least a portion of said device; and
heat treating said low liquidus temperature inorganic material to create the gas/fluid barrier later over said at least a portion of said device.
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Accused Products
Abstract
A method for inhibiting oxygen and moisture degradation of a device and the resulting device are described herein. To inhibit the oxygen and moisture degradation of the device, a low liquidus temperature (LLT) material which typically has a low liquidus temperature (or in specific embodiments a low glass transition temperature) is used to form a barrier layer on the device. The LLT material can be, for example, tin fluorophosphate glass, chalcogenide glass, tellurite glass and borate glass. The LLT material can be deposited onto the device by, for example, sputtering, evaporation, laser-ablation, spraying, pouring, frit-deposition, vapor-deposition, dip-coating, painting or rolling, spin-coating or any combination thereof. Defects in the LLT material from the deposition step can be removed by a consolidation step (heat treatment), to produce a pore-free, gas and moisture impenetrable protective coating on the device. Although many of the deposition methods are possible with common glasses (i.e. high melting temperature glasses like borate silicate, silica, etc.), the consolidation step is only practical with the LLT material where the consolidation temperature is sufficiently low so as to not damage the inner layers in the device.
149 Citations
30 Claims
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1. A method for for creating a gas/fluid barrier layer on a device, said method comprising the steps of:
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depositing a low liquidus temperature inorganic material over at least a portion of said device; and
heat treating said low liquidus temperature inorganic material to create the gas/fluid barrier later over said at least a portion of said device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An organic electronic device comprising:
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a substrate plate;
at least one organic electronic or optoelectronic layer; and
a low liquidus temperature inorganic material, wherein said at least one electronic or optoelectronic layer is hermetically sealed between said low liquidus temperature inorganic material and said substrate plate. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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- 20. A device which has at least a portion thereof sealed with a film of a low liquidus temperature (LLT) material.
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27. (canceled)
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28. A low liquidus temperature material comprising:
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Sn (20-85 wt %) P (2-20 wt %) O (10-36 wt %) F (10-36 wt %) Nb (0-5 wt %); and
at least 75% total of Sn+P+O+F. - View Dependent Claims (29)
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Specification