×

Method for test strip manufacturing and test card analysis

  • US 20070040567A1
  • Filed: 08/16/2006
  • Published: 02/22/2007
  • Est. Priority Date: 08/16/2005
  • Status: Abandoned Application
First Claim
Patent Images

1. A method of manufacturing a plurality of test strips, comprising:

  • forming a web containing a conductive layer and a base layer;

    partially forming said plurality of test strips by electrically isolating a first group of conductive components in the conductive layer using a first process; and

    subsequently forming said plurality of test strips by electrically isolating a second group of conductive components in the conductive layer using a second process wherein first and second processes are not the same.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×