Method and apparatus for semi-automatic generation of test grid environments in grid computing

• US 20070046282A1
• Filed: 08/31/2005
• Published: 03/01/2007
• Est. Priority Date: 08/31/2005
• Status: Abandoned Application

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Kumhyr, David, Childress, Rhonda, Crawford, Catherine, Pennell, Neil, Magnone, Paolo
• Application Number:
  US11/216,960
• Publication Number:
  US 20070046282A1
• Time in Patent Office: Days
• US Class Current: 716/103
• CPC Class Codes: G06F 11/263 Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
• CPC Class Codes: G06Q 10/06 Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling

Abstract

Generating a description of a test grid environment for use in a grid computing environment. A database containing a number of test snapshots is generated. Each test snapshot reflects a previously used grid test environment, and each test snapshot includes a grid configuration used to implement a particular test scenario for a particular application. When a new, desired, test scenario is generated, a description of the new test scenario is entered as a query to the database. Based on the information in the database, a proposed test grid environment description is produced.

Claims

1. A method in a data processing system for generating a description of a test grid environment for use in a grid computing environment, said method comprising:

querying a database with a query, wherein the database comprises a plurality of test snapshots and wherein the query includes a test scenario description as an input; and

generating a test grid environment description based on results of the query.

2. The method of claim 1, wherein each test snapshot in the plurality of test snapshots comprises an association of a description of a particular grid configuration with a particular test scenario.

3. The method of claim 1, further comprising:

describing a current grid configuration of a computing grid to produce a current grid configuration description;

comparing the current grid configuration description with the test grid environment description to produce a comparison; and

generating a dependency graph based on the comparison.

4. The method of claim 3, wherein the dependency graph comprises a description of how resources in the current grid should be modified in order to effect a change from the current grid configuration to the test grid environment.

5. The method of claim 1, further comprising:

describing a current grid configuration of a computing grid to produce a current grid configuration description; and

changing the current grid configuration to match the test grid environment description, wherein the test grid environment is produced.

6. The method of claim 5, further comprising:

performing a test scenario in the test grid environment.

7. The method of claim 3, further comprising:

changing the current grid configuration based on the dependency graph to produce the test grid environment.

8. The method of claim 7, further comprising:

performing a test scenario in the test grid environment.

9. A data processing system comprising:

a bus system;

a communications system connected to the bus system;

a memory connected to the bus system, wherein the memory includes a set of instructions;

an instruction execution unit; and

a processing unit connected to the bus system, wherein the processing unit executes the set of instructions to query a database with a query, wherein the database comprises a plurality of test snapshots and wherein the query includes a test scenario description as an input; and

generate a test grid environment description based on results of the query.

10. The data processing system of claim 9, wherein each test snapshot in the plurality of test snapshots comprises an association of a description of a particular grid configuration with a particular test scenario.

11. The data processing system of claim 9, further comprising:

a set of instructions to describe a current grid configuration of a computing grid to produce a current grid configuration description;

compare the current grid configuration description with the test grid environment description to produce a comparison; and

generate a dependency graph based on the comparison.

12. The data processing system of claim 11, wherein the dependency graph comprises a description of how resources in the current grid should be modified in order to effect a change from the current grid configuration to the test grid environment.

13. The data processing system of claim 9, further comprising:

a set of instructions to describe a current grid configuration of a computing grid to produce a current grid configuration description; and

change the current grid configuration to match the test grid environment description, wherein the test grid environment is produced.

14. The data processing system of claim 13, further comprising:

a set of instructions to perform a test scenario in the test grid environment.

15. The data processing system of claim 11, further comprising:

a set of instructions to change the current grid configuration based on the dependency graph to produce the test grid environment.

16. The data processing system of claim 15, further comprising:

a set of instructions to perform a test scenario in the test grid environment.

17. A computer program product comprising:

a computer usable medium including computer usable program code for generating a description of a test grid environment for use in a grid computing environment, the computer program product including;

computer usable program code for querying a database with a query, wherein the database comprises a plurality of test snapshots and wherein the query includes a test scenario description as an input; and

computer usable program code for generating a test grid environment description based on results of the query.

18. The computer program product of claim 17, wherein each test snapshot in the plurality of test snapshots comprises an association of a description of a particular grid configuration with a particular test scenario.

19. The computer program product of claim 17, further comprising:

computer usable program code for describing a current grid configuration of a computing grid to produce a current grid configuration description;

computer usable program code for comparing the current grid configuration description with the test grid environment description to produce a comparison; and

computer usable program code for generating a dependency graph based on the comparison.

20. The computer program product of claim 19, wherein the dependency graph comprises a description of how resources in the current grid should be modified in order to effect a change from the current grid configuration to the test grid environment.

21. The computer program product of claim 17, further comprising:

computer usable program code for describing a current grid configuration of a computing grid to produce a current grid configuration description; and

computer usable program code for changing the current grid configuration to match the test grid environment description, wherein the test grid environment is produced.

22. The computer program product of claim 21, further comprising:

computer usable program code for performing a test scenario in the test grid environment.

23. The computer program product of claim 19, further comprising:

computer usable program code for changing the current grid configuration based on the dependency graph to produce the test grid environment.

24. The computer program product of claim 23, further comprising:

computer usable program code for performing a test scenario in the test grid environment.