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Method of measuring in situ differential emissivity and temperature

  • US 20070047615A1
  • Filed: 09/01/2005
  • Published: 03/01/2007
  • Est. Priority Date: 09/01/2005
  • Status: Active Grant
First Claim
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1. A method of measuring the in situ differential emissivity between two sites on a surface of an object, comprising:

  • detecting infrared radiation arising at a first wavelength from a first site on a surface of a body;

    detecting infrared radiation arising at said first wavelength from said first site while said first site is irradiated by external infrared radiation at said first wavelength;

    detecting infrared radiation arising at said first wavelength from a second site on the surface of said body;

    detecting infrared radiation arising at said first wavelength from said second site while said second site is irradiated by external infrared radiation at said first wavelength; and

    determining an in situ differential emissivity value based on the detection of infrared radiation arising from said first site and said second site.

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