Polar sensor patterns

• US 20070057167A1
• Filed: 08/28/2006
• Published: 03/15/2007
• Est. Priority Date: 09/09/2005
• Status: Active Grant

• Current Assignee: Synaptics Incorporated
• Original Assignee: Synaptics Incorporated
• Inventors: Golovchenko, Mykola, MacKey, Bob
• Granted Patent: US 8,854,333 B2
• Time in Patent Office: Days
• US Class Current: 250/221
• CPC Class Codes: G06F 3/03547 Touch pads, in which fingers can move on a surface
• CPC Class Codes: G06F 3/0445 using two or more layers of sensing electrodes, e.g. using two layers of electrodes separated by a dielectric layer

Abstract

Patterns of sensor elements that can be used in capacitance sensing devices are described. A plurality of sensor elements extends in a radial direction from a shared center. A first subset of the sensor elements extend like spirals in a clockwise direction, and a second subset of the sensor elements extend like spirals in a counterclockwise direction.

Claims

1. A capacitance sensing apparatus comprising:

a plurality of sensor elements extending in a radial direction from a shared center, said plurality of sensor elements comprising;

a first subset of sensor elements that extend spiral-like in a clockwise direction; and

a second subset of sensor elements that extend spiral-like in a counterclockwise direction.

2. The apparatus of claim 1 wherein at least two sensor elements of said first subset have rotation symmetry about said center and wherein at least two sensor elements of said second subset have rotation symmetry about said center.

3. The apparatus of claim 1 wherein a sensor element of said first subset and a sensor element of said second subset have reflection symmetry.

4. The apparatus of claim 1 wherein an areal measure of a sensor element is substantially equal for each sensor element of said plurality of sensor elements.

5. The apparatus of claim 1 wherein a measure of capacitance, if measured in the absence of an object to be sensed, is substantially equal for each sensor element of said plurality of sensor elements.

6. The apparatus of claim 1 wherein a capacitance induced in a first sensor element if an object is at a distance from said first sensor element and a capacitance induced in a second sensor element if said object is at said distance from said second sensor element are substantially equal.

7. The apparatus of claim 1 further comprising a deformable conductive surface in proximity to said plurality of sensor elements, wherein said sensor elements measure a change in capacitance induced if said conductive surface is deformed.

8. The apparatus of claim 1 wherein said plurality of sensor elements are deformable and further comprising a conductive surface in proximity to said plurality of sensor elements, wherein said sensor elements measure a change in capacitance induced if a sensor element is deformed.

9. The apparatus of claim 1 wherein said plurality of sensor elements are arranged in a pattern comprising a plurality of radiating segments and a plurality of concentric bands that intersect said radiating segments, wherein a first portion of a sensor element of said plurality of sensor elements is located within a first radiating segment and a first concentric band and wherein a second portion of said sensor element is located within a second radiating segment and a second concentric band, wherein said first and second radiating segments are adjacent each other and wherein said first and second concentric bands are adjacent each other.

10. The apparatus of claim 1 wherein said plurality of sensor elements comprise a first sensor element intertwined with a second sensor element, wherein said first and second sensor elements each comprise a series of segments connected in a series of spiral-like patterns.

11. A method of sensing an object, said method comprising:

receiving output signals from one or more sensor elements, wherein said sensor elements extend from a central position to the edges of said sensing region, wherein said sensor elements comprise a first subset of sensor elements that extend spiral-like in a clockwise direction about said central position and a second subset of sensor elements that extend spiral-like in a counterclockwise direction about said central position; and

determining a position within said sensing region by comparing measures of said outputs signals.

12. The method of claim 11 wherein at least two sensor elements of said first subset have rotation symmetry about said central position and wherein at least two sensor elements of said second subset have rotation symmetry about said central position.

13. The method of claim 11 wherein a sensor element of said first subset and a sensor element of said second subset have reflection symmetry.

14. The method of claim 11 wherein a measure of capacitance, if measured in the absence of said object, is substantially equal for each of said sensor elements.

15. The method of claim 11 wherein a capacitance induced in a first sensor element if said object is at a distance from said first sensor element and a capacitance induced in a second sensor element if said object is at said distance from said second sensor element are substantially equal.

16. The method of claim 11 wherein a deformable conductive surface is disposed in proximity to said plurality of sensor elements, wherein said sensor elements measure a change in capacitance induced if said conductive surface is deformed.

17. The method of claim 11 wherein said plurality of sensor elements are deformable and wherein a conductive surface is disposed in proximity to said plurality of sensor elements, wherein said sensor elements measure a change in capacitance induced if a sensor element is deformed.

18. The method of claim 11 wherein said sensor elements are arranged in a pattern comprising a plurality of radiating segments and a plurality of concentric bands that intersect said radiating segments, wherein a first portion of said sensor elements is located within a first radiating segment and a first concentric band and wherein a second portion of said sensor element is located within a second radiating segment and a second concentric band, wherein said first and second radiating segments are adjacent each other and wherein said first and second concentric bands are adjacent each other.

19. The method of claim 11 wherein said sensor elements comprise a first sensor element intertwined with a second sensor element, wherein said first and second sensor elements each comprise a series of segments connected in a series of spiral-like patterns.

20. A capacitance sensing apparatus comprising:

a plurality of radiating sensor elements, said plurality of sensor elements comprising a first subset of sensor elements and a second subset of sensor elements;

wherein at least two sensor elements within said first subset have rotation symmetry but not reflection symmetry and wherein at least two sensor elements within said second subset have rotation symmetry but not reflection symmetry; and

wherein a sensor element of said first subset and a sensor element of said second subset have reflection symmetry but not rotation symmetry.

21. The apparatus of claim 20 wherein said first subset radiates spiral-like in a clockwise direction and said second subset radiates spiral-like in a counterclockwise direction.

22. The apparatus of claim 20 wherein an areal measure of a sensor element is substantially equal for each sensor element in said plurality of sensor elements.

23. The apparatus of claim 20 wherein a measure of capacitance, if measured in the absence of an object to be sensed, is substantially equal for each sensor element in said plurality of sensor elements.

24. The apparatus of claim 20 wherein a capacitance induced in a first sensor element if an object is at a distance from said first sensor element and a capacitance induced in a second sensor element if said object is at said distance from said second sensor element are substantially equal.

25. The apparatus of claim 20 further comprising a deformable conductive surface in proximity to said plurality of sensor elements, wherein said sensor elements measure a change in capacitance induced if said conductive surface is deformed.

26. The apparatus of claim 20 wherein said plurality of sensor elements are deformable and further comprising a conductive surface in proximity to said plurality of sensor elements, wherein said sensor elements measure a change in capacitance induced if a sensor element is deformed.

27. The apparatus of claim 20 wherein said plurality of sensor elements are arranged in a pattern comprising a plurality of radiating segments and a plurality of concentric bands that intersect said radiating segments, wherein a first portion of a sensor element in said plurality of sensor elements is located within a first radiating segment and a first concentric band and wherein a second portion of said sensor element is located within a second radiating segment and a second concentric band, wherein said first and second radiating segments are adjacent each other and wherein said first and second concentric bands are adjacent each other.

28. The apparatus of claim 20 wherein said plurality of sensor elements comprise a first sensor element intertwined with a second sensor element, wherein said first and second sensor elements each comprise a series of segments connected in a series of spiral-like patterns.