System and method for test probe management

• US 20070063871A1
• Filed: 09/20/2005
• Published: 03/22/2007
• Est. Priority Date: 09/20/2005
• Status: Active Grant

• Current Assignee: Viavi Solutions, Inc. (Lumentum Holdings Inc.)
• Original Assignee: JDS Uniphase Corporation (Lumentum Holdings Inc.)
• Inventors: Liu, Jerry, Purdy, Glen, Engel, Glen
• Granted Patent: US 7,868,780 B2
• Time in Patent Office: Days
• US Class Current: 340/870.70
• CPC Class Codes: H04Q 9/00 Arrangements in telecontrol or telemetry systems for selectively calling a substation from a main station, in which substation desired apparatus is selected for applying a control signal thereto or for obtaining measured values therefrom

Abstract

Individual probe management is accomplished in a measurement system by communicating configuration data to each probe based on that probe'"'"'s received metadata. In one embodiment, the configuration data is sent from a server and the server does not keep track of the probe'"'"'s configuration. The configuration data can be, for example, parameters used to directly configure the probe or software modules for running on the probe.

Claims

1. A method for use in a measurement system, said method comprising:

receiving configuration data at a plurality of spaced apart probes, wherein said configuration data for each probe is not uniquely associated with said probe, and wherein said configuration data is operable for establishing the configuration of said probe; and

communicating measurements in accordance with said configuration data.

2. The method of claim 1 wherein said measurements are communicated to said measurement system.

3. The method of claim 1 further comprising:

communicating metadata to said measurement system from said probes.

4. The method of claim 1 wherein said configuration data is communicated to said probes at least in part from said measurement system.

5. The method of claim 4 wherein said measurement system does keep track of said probe configurations.

6. The method of claim 1 wherein said configuration data is communicated to said probes at least in part from another of said probes.

7. A probe for use in a measurement system, said probe comprising:

means for receiving updated configuration data, wherein said updated configuration data is operable for establishing a new configuration of said probe, wherein said updated configuration data is communicated to said probe at least in part from said measurement system, without said measurement system knowing the current configuration of said probe; and

means for communicating measurements in accordance with said configuration data.

8. The probe of claim 7 further comprising:

means for communicating said measurements to said measurement system.

9. The probe of claim 7 further comprising:

means for communicating said measurements to at least one other of said probes.

10. The probe of claim 7 further comprising:

means for communicating metadata to said measurement system.

11. The probe of claim 7 wherein said configuration data is communicated to said probe at least in part from another of said probes.

12. A measurement system comprising:

a plurality of spaced apart probes;

communication links from a central processing system to at least some of said probes; and

configuration control at said central processing system for sending probe configuration data from said central processing system over said communication links to said at least some of said probes, without said measurement system keeping track of the current configuration of said probes.

13. The measurement system of claim 12 further comprising:

communication control at least at some of said probes for sending metadata from said probes to said central processing system.

14. The measurement system of claim 13 wherein said configuration data for a particular probe is based, at least in part, on metadata communicated from said particular probe.

15. The measurement system of claim 12 wherein said communication control at said probe sends data obtained at said probe to said central processing system.

16. The measurement system of claim 15 wherein said obtained data from said probes is processed anonymously.

17. The measurement system of claim 15 wherein data communicated from said probe comprises probe identity data as well as obtained data, and wherein said obtained data from said probes is processed as an aggregate among a plurality of probes, said aggregate being determined, at least in part, by said probe identity information.

18. The measurement system of claim 12 further comprising:

communication control at least at some of said probes for sending configuration data among at least some of said probes.

19. A probe for use in a measurement system, said probe comprising:

storage for receiving configuration data, wherein said configuration data is uniquely associated with said probe, and wherein said configuration data is operable for establishing the configuration of said probe; and

an output for sending measurement data from said probe to a remote data capture point, said data packaged in accordance with received configuration data.

20. The probe of claim 19 wherein said configuration data is sent to said probe from said data collection point.

21. The probe of claim 19 further comprising:

a communication output for communicating data to at least one other of said probes, said communicated data comprising configuration data.

22. The probe of claim 19 wherein said output is further operable for communicating metadata to said data collection point.

23. The probe of claim 19 wherein said configuration data is communicated to said probe at least in part from another of said probes.