System and method for selective distribution of measurement device configuration in a loosely coupled autonomous system

• US 20070067113A1
• Filed: 09/20/2005
• Published: 03/22/2007
• Est. Priority Date: 09/20/2005
• Status: Active Grant

• Current Assignee: Viavi Solutions, Inc. (Lumentum Holdings Inc.)
• Original Assignee: JDS Uniphase Corporation (Lumentum Holdings Inc.)
• Inventors: Liu, Jerry, Purdy, Glen, Engel, Glenn
• Granted Patent: US 8,762,076 B2
• Time in Patent Office: Days
• US Class Current: 702/33
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT

Abstract

Probe configuration is achieved in a measurement system in which probes are given possible configuration data depending upon conditions in an area relevant to the area of the probe. The possible probe configurations include global boundaries, such as time, and each probe then, based upon the possible configurations, selects a configuration. In one embodiment, the probe may interact with a central processor to further define the probe configuration. In one embodiment, probes may communicate with other probes, both to help define their operating environment and to optionally provide configuration data to another probe.

Claims

1. A probe for use in a measurement system;

said probe comprising;

memory for storing data pertaining to possible configurations for said probe;

a processor for selecting one of said possible probe configurations.

2. The probe of claim 1 further comprising:

a location determination device; and

wherein said possible probe configurations comprise;

location parameters for use by said processor to select a configuration from said possible configurations at least partially based on a determined location of said probe as suggested by said measurement system controller.

3. The probe of claim 2 wherein said processor is further operable to change said probe configuration from time to time depending upon a determined location of said probe.

4. The probe of claim 1 wherein said processor selection of probe configuration is dependant upon factors unique to said probe.

5. The probe of claim 4 wherein said unique factors are selected from the list of:

number of other probes in a defined area;

configurations of probes in a defined area;

a probability table built into said probe for each possible selection;

number of measurements made of a certain type by said probe;

participation percentage, measurement values, connectivity status, time.

6. The probe of claim 1 further comprising:

a communication device for communicating parameters pertaining to said probe to a data gathering point.

7. The probe of claim 6 wherein said possible probe configurations are communicated to said probe from said data gathering point.

8. The probe of claim 7 wherein said possible configurations are dependant upon said probe parameters communicated from said probe.

9. The probe of claim 1 wherein said possible probe configurations are communicated to said probe from a data gathering point.

10. The probe of claim 1 wherein said possible probe configurations are communicated to said probe, at least in part, from another probe.

11. The probe of claim 1 wherein said possible probe configuration data is at least one runnable software module.

12. A method for use in a measurement system, said method comprising:

receiving at a plurality of spaced apart probes configuration data, wherein said configuration data for each probe is a list of possible configurations for said probe; and

selecting, under control of each said probe, from said list of possible configurations, a configuration for use by said probe.

13. The method of claim 12 further comprising:

communicating measurements in accordance with said configuration data.

14. The method of claim 13 wherein said measurements are communicated to said measurement system.

15. The method of claim 12 further comprising:

communicating metadata to said measurement system from said probes.

16. The method of claim 12 wherein said configuration data is communicated to said probes at least in part from said measurement system.

17. The method of claim 12 wherein said configuration data is communicated to said probes at least in part from another of said probes.

18. The method of claim 12 wherein said processor is further operable to change said probe configuration from time to time depending upon a determined location of said probe.

19. The probe of claim 12 wherein said processor selection of probe configuration is dependant upon factors unique to said probe.

20. The probe of claim 19 wherein said unique factors are selected from the list of:

numbers of other probes in a defined area;

configurations of probes in a defined area;

a probability table built into said probe for each possible selection;

number of measurements made of a certain type by said probe;

participation percentage, measurement values, connectivity status, time.

21. A probe for use in a measurement system, said probe comprising:

means for receiving a list of possible configuration data; and

means for configuring said probe with one of said received possible configuration data.

22. The probe of claim 21 further comprising:

means for communicating measurements in accordance with said configuration data.

23. The probe of claim 22 further comprising:

means for communicating said measurements to said measurement system.

24. The probe of claim 23 further comprising:

means for communicating metadata to said measurement system.

25. A measurement system comprising:

a plurality of spaced apart probes;

communication links from a central processing system to at least some of said probes; and

configuration control at said probe for configuring said probe based upon selected configuration data received from said central processing system over said communication link to said probe.

26. The measurement system of claim 25 further comprising:

communication control at least at some of said probes for sending metadata from said probes to said central processing system.

27. The measurement system of claim 26 wherein said configuration data for a particular probe is based, at least in part, on metadata communicated from said particular probe.