Methods and apparatus for ion sources, ion control and ion measurement for macromolecules

• US 20070075240A1
• Filed: 09/08/2006
• Published: 04/05/2007
• Est. Priority Date: 02/23/2004
• Status: Active Grant

• Current Assignee: Andreas Hieke
• Original Assignee: Gemio Technologies, Inc.
• Inventors: Hieke, Andreas
• Granted Patent: US 8,003,934 B2
• Time in Patent Office: Days
• US Class Current: 250/282
• CPC Class Codes: G21K 1/087 by electrical means
• CPC Class Codes: G21K 5/02 having no beam-forming means
• CPC Class Codes: H01J 37/08 Ion sources; Ion guns
• CPC Class Codes: H01J 49/04 Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
• CPC Class Codes: H01J 49/06 Electron- or ion-optical arrangements
• CPC Class Codes: H01J 49/067 Ion lenses, apertures, skimmers
• CPC Class Codes: H01J 49/164 Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI] sample holders H01J49/0418

Abstract

Disclosed are methods, apparatus, systems, processes and other inventions relating to: ion sources with controlled electro-pneumatic superposition, ion source synchronized to RF multipole, ion source with charge injection, optimized control in active feedback system, radiation supported charge-injection liquid spray, ion source with controlled liquid injection as well as various embodiments and combinations of each of the foregoing.

Claims

1. A method for controlling the ion current of an ion transmission device, wherein an ion source is in ion communication with and provides ions to the ion transmission device, the method comprising:

coordinating a value for each of the at least one operating parameter of the ion source with a value for each of at least one operating parameter of the ion transmission device.