Junction barrier schottky (JBS) with floating islands
First Claim
1. A Schottky diode comprising:
- a Schottky barrier and a plurality of dopant regions disposed near said Schottky barrier as floating islands to function as PN junctions for preventing a leakage current generated from a reverse voltage.
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Accused Products
Abstract
A Schottky diode includes a Schottky barrier and a plurality of dopant regions disposed near the Schottky barrier as floating islands to function as PN junctions for preventing a leakage current generated from a reverse voltage. At least a trench opened in a semiconductor substrate with a Schottky barrier material disposed therein constitutes the Schottky barrier. The Schottky barrier material may also be disposed on sidewalls of the trench for constituting the Schottky barrier. The trench may be filled with the Schottky barrier material composed of Ti/TiN or a tungsten metal disposed therein for constituting the Schottky barrier. The trench is opened in a N-type semiconductor substrate and the dopant regions includes P-doped regions disposed under the trench constitute the floating islands. The P-doped floating islands may be formed as vertical arrays under the bottom of the trench.
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Citations
21 Claims
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1. A Schottky diode comprising:
a Schottky barrier and a plurality of dopant regions disposed near said Schottky barrier as floating islands to function as PN junctions for preventing a leakage current generated from a reverse voltage. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method for manufacturing a Schottky diode comprising:
forming a plurality of dopant regions followed by forming a Schottky barrier near said dopant regions as floating islands to function as PN junctions for preventing a leakage current generated from a reverse voltage applied to said Schottky barrier. - View Dependent Claims (18, 19, 20)
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21. A Schottky diode comprising:
a Schottky barrier and a plurality of regions disposed near said Schottky barrier to function as PN junctions for distributing a reverse bias voltage over said PN junctions and said Schottky barrier for reducing a leakage current generated from said reverse bias voltage.
Specification