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Method for Reducing Word Line Current in Magnetoresistive Random Access Memory and Structure Thereof

  • US 20070086233A1
  • Filed: 10/06/2006
  • Published: 04/19/2007
  • Est. Priority Date: 10/17/2005
  • Status: Active Grant
First Claim
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1. The method for reducing word line currents in magnetoresistive random access memory (MRAM), comprising:

  • forming an MRAM bit, comprising;

    forming a conductive section on a first magnetic section;

    forming a second magnetic section on the conductive section;

    disposing the MRAM bit between a pair of word lines, wherein the first magnetic section to a first word line is in the range of 50 Angstroms to 200 Angstroms, and the second magnetic section to a second word line is in the range of 50 Angstroms to 200 Angstroms according to a magnetic field strength is squared when a distance between the first magnetic section or the second magnetic section to the corresponding word line is halved.

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