Method To Determine The Depth-Of-Interaction Function For PET Detectors

• US 20070090298A1
• Filed: 10/20/2006
• Published: 04/26/2007
• Est. Priority Date: 10/20/2005
• Status: Active Grant

• Current Assignee: The Research Foundation for The State University of New York (State University of New York)
• Original Assignee: The Research Foundation for The State University of New York (State University of New York)
• Inventors: Shao, Yiping
• Granted Patent: US 7,482,593 B2
• Time in Patent Office: Days
• US Class Current: 250/366
• CPC Class Codes: A61B 6/037 Emission tomography
• CPC Class Codes: G01T 1/20187 Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
• CPC Class Codes: G01T 1/2985 In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); using external radiation sources A61B6/02

Abstract

A three-dimensional PET detector of a type having a scintillation crystal and first and second photosensitive detectors arranged one at each opposite end face of the crystal for detecting scintillation interactions within the crystal is calibrated to determine a depth-of-interaction (DOI) function thereof by irradiating the crystal to cause a predetermined distribution of interactions along a depth axis of the crystal, and applying probability theory to signal data collected by the two photosensitive detectors. The method provides a DOI function that indicates DOI position as a function of a signal ratio R obtained from the signal data.

Claims

1. A method of determining a depth-of-interaction (DOI) function of a detector having a scintillation crystal and first and second photosensitive detectors arranged one at each opposite end face of the crystal for detecting scintillation interactions within the crystal, the method comprising the steps of:

irradiating the crystal to provide a predetermined distribution of scintillation interactions along a depth axis of the crystal extending between the opposite end faces of the crystal;

collecting a plurality of output signal pairs each including a first output signal associated with the first photosensitive detector and a second output signal associated with the second photosensitive detector, each collected output signal pair corresponding to a respective scintillation interaction at a specific DOI position z;

calculating a signal ratio R for each of the plurality of output signal pairs, the signal ratio R representing a strength of the first output signal relative to the sum of the first and second output signals; and

applying probability theory to the calculated signal ratios R to determine a cumulated distribution function CDF(R), the cumulated distribution function CDF(R) indicating DOI position z as a function of signal ratio R.

2. The method according to claim 1, wherein the predetermined distribution is a uniform distribution of scintillation interactions along the depth axis of the crystal.

3. The method according to claim 2, wherein the uniform distribution is generated by a uniform flood source at a fixed position.

4. The method according to claim 1, wherein the step of applying probability theory includes the substeps of:

determining a signal ratio frequency distribution H(R) based on the calculated signal ratios R;

calculating a probability density function PDF(R) based on the signal ratio frequency distribution H(R), the probability density function PDF(R) representing a measured probability that a scintillation interaction at a DOI position z will produce a signal ratio R; and

calculating the cumulated distribution function CDF(R) based on the probability density function PDF(R).

5. The method according to claim 1, wherein the detector detects gamma rays.

6. The method according to claim 1, wherein the detector detects x-rays.

7. In a method of determining a depth-of-interaction (DOI) function of a detector having a scintillation crystal and first and second photosensitive detectors arranged one at each opposite end face of the crystal for detecting scintillation interactions within the crystal, the improvement comprising the step of:

irradiating the crystal with radiation from a stationary source providing a predetermined distribution of scintillation interactions along a depth axis of the crystal extending between the opposite end faces of the crystal.

8. The improvement according to claim 7, wherein the predetermined distribution is a uniform distribution of scintillation interactions along the depth axis of the crystal.

9. In a method of determining a depth-of-interaction (DOI) function of a detector having a scintillation crystal and first and second photosensitive detectors arranged one at each opposite end face of the crystal for detecting scintillation interactions within the crystal, the improvement comprising the step of:

applying probability theory to determine a cumulated distribution function CDF(R), the cumulated distribution function CDF(R) indicating DOI position z as a function of a signal ratio R calculated from a first output signal and a second output signal generated by the first and second photosensitive detectors, respectively.

10. The improvement according to claim 9, wherein probability theory is applied to signal data collected from the first and second photosensitive detectors while the crystal is uniformly irradiated along a depth axis of the crystal extending between the opposite end faces of the crystal.

11. A method of determining a drifted depth-of-interaction (DOI) function of a detector having a scintillation crystal and first and second photosensitive detectors arranged one at each opposite end face of the crystal for detecting scintillation interactions within the crystal, an initial DOI function of the detector being known, the method comprising the steps of:

a) irradiating the crystal to provide a distribution of scintillation interactions along a depth axis of the crystal extending between the opposite end faces of the crystal;

b) collecting a plurality of output signal pairs each including a first output signal associated with the first photosensitive detector and a second output signal associated with the second photosensitive detector, each collected output signal pair corresponding to a respective scintillation interaction at a specific DOI position z;

c) calculating a signal ratio R for each of the plurality of output signal pairs, the signal ratio R representing a strength of the first output signal relative to the sum of the first and second output signals; and

d) applying probability theory to the calculated signal ratios R to determine a first cumulated distribution function CDF₀(R);

e) repeating steps (a) through (d) after drift has occurred, including providing the same distribution of scintillation interactions along a depth axis of the crystal, to determine a second cumulated distribution function CDF₁(R);

f) calculating a drift scale factor M(R)=CDF₁(R)/CDF₀(R); and

g) multiplying the initial DOI function by the drift scale factor M(R) to obtain the drifted DOI function.