Pick and place machine with improved component pick image processing

• US 20070091323A1
• Filed: 09/14/2006
• Published: 04/26/2007
• Est. Priority Date: 09/14/2005
• Status: Active Grant

• Current Assignee: CyberOptics Corporation (Nordson Corporation)
• Original Assignee: CyberOptics Corporation (Nordson Corporation)
• Inventors: Manickam, Swaminathan, Case, Steven, Konicek, John, Duquette, David
• Granted Patent: US 7,545,514 B2
• Time in Patent Office: Days
• US Class Current: 356/621
• CPC Class Codes: H05K 13/0409 Sucking devices
• CPC Class Codes: H05K 13/0812 the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement

Abstract

A pick and place machine includes a sensor disposed to acquire an image of a nozzle before a pick operation, and one or more images after the pick operation. Image analytics based upon these images reveal important characteristics that can be used to classify the pick operation. In some embodiments, a plurality of after-pick images are acquired at different poses (angular orientations).

Claims

1. A pick and place machine comprising:

a placement head having a nozzle for temporarily adhering a component thereto;

a robotic system for generating relative movement between the placement head and a workpiece;

a sensor having an illuminator disposed to direct illumination at the component, the sensor also having image acquisition system disposed to acquire a two-dimensional before-pick shadow image of the nozzle, and to acquire at least one two-dimensional after-pick shadow image of the nozzle and the component; and

a processor adapted to process the before and after-pick images to characterize a pick operation.

2. The pick and place machine of claim 1, wherein the before-pick shadow image is a before-pick non-focused shadow image.

3. The pick and place machine of claim 2, wherein each after-pick shadow image is a non-focused shadow image.

4. The pick and place machine of claim 1, wherein the before-pick shadow image is a focused before-pick shadow image.

5. The pick and place machine of claim 4, wherein each after-pick shadow image is a focused shadow image.

6. The pick and place machine of claim 1, wherein the sensor includes an area illuminator to back light the component.

7. The pick and place machine of claim 1, wherein the image acquisition system includes a charge-coupled device.

8. The pick and place machine of claim 1, wherein the image acquisition system includes a complementary metal oxide semiconductor device.

9. The pick and place machine of claim 1, wherein the sensor includes imaging optics.

10. The pick and place machine of claim 9, wherein the sensor includes illumination optics.

11. The pick and place machine of claim 1, wherein the sensor includes illumination optics.

12. The pick and place machine of claim 1, wherein the image acquisition system is disposed to acquire a plurality of after-pick images, each after-pick image being acquired at a different component pose.

13. The pick and place machine of claim 12, wherein characterization of the pick operation is based upon examining variance of a metric among the after-pick images.

14. A sensor for sensing a pick operation in a pick and place machine, the sensor comprising:

an illuminator disposed to direct illumination at a component held upon a nozzle of the pick and place machine;

an image acquisition system disposed to acquire a two-dimensional before-pick shadow image of the nozzle, and to acquire at least one two-dimensional after-pick shadow image of the nozzle and the component; and

a processor adapted to process the before and after-pick images to characterize a pick operation.

15. The sensor of claim 14, wherein the image acquisition system includes a charge-coupled device.

16. The sensor of claim 14, wherein the image acquisition system includes a complementary metal oxide semiconductor device.

17. The sensor of claim 14, wherein the sensor includes imaging optics disposed to image a shadow onto an area detector.

18. The sensor of claim 17, wherein the sensor includes illumination optics to decrease divergence of the illumination.

19. The sensor of claim 14, wherein the sensor includes illumination optics to decrease divergence of the illumination.

20. The sensor of claim 14, wherein the image acquisition system is disposed to acquire a plurality of after-pick images, each after-pick image being acquired at a different component pose.

21. The sensor of claim 20, wherein characterization of the pick operation is based upon examining variance of a metric among the after-pick images.

22. A method of characterizing a pick operation of a pick and place machine, the method comprising:

obtaining a before-pick shadow image of a nozzle of the pick and place machine;

obtaining at least one after-pick shadow image of the nozzle;

subtracting the before-pick image from the at least one after-pick image to generate at least one difference image;

determining at least one metric based upon the difference image; and

characterizing the pick operation based upon the at least one metric.

23. The method of claim 22, and further comprising extracting an image of the nozzle from the before-pick image to generate a template.

24. The method of claim 23, and further comprising using the template to identify the nozzle in each after-pick image.

25. The method of claim 22, and further comprising co-registering the before-pick image with each after-pick image prior to subtracting the before-pick image from each after-pick image.

26. The method of claim 25, wherein co-registering includes utilizing a normalized gray-scale correlation.

27. The method of claim 22, and further comprising thresholding the difference image to generate a thresholded difference image.

28. The method of claim 27, and further comprising performing a morphological closing operation upon the thresholded difference image.

29. The method of claim 22, wherein obtaining at least one after-pick shadow image of the nozzle includes obtaining a plurality of after-pick images, each image acquired relative to a different pose of the component.

30. The method of claim 22, wherein all images are of non-focused shadows.

31. The method of claim 22, wherein all images are of focused shadows.