Method of fabricating GaN
First Claim
1. A method of forming a porous GaN layer having a thickness of 10-1000 nm comprising:
- etching a GaN substrate in a reaction chamber in an HCl and NH3 gas atmosphere.
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Accused Products
Abstract
A method of fabricating a thick GaN layer includes forming a porous GaN layer having a thickness of 10-1000 nm by etching a GaN substrate in a reaction chamber in an HCl and NH3 gas atmosphere and forming an in-situ GaN growth layer in the reaction chamber. The method of forming the porous GaN layer and the thick GaN layer in-situ proceeds in a single chamber. The method is very simplified compared to the prior art. In this way, the entire process is performed in one chamber, and in particular, GaN etching and growth are performed using an HVPE process gas such that costs are greatly reduced.
18 Citations
15 Claims
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1. A method of forming a porous GaN layer having a thickness of 10-1000 nm comprising:
etching a GaN substrate in a reaction chamber in an HCl and NH3 gas atmosphere. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of fabricating GaN comprising:
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forming a porous GaN layer having a thickness of 10-1000 nm by etching a GaN substrate in a reaction chamber in an HCl and NH3 gas atmosphere; and
forming the GaN growth layer on the porous GaN layer to a predetermined thickness by supplying a GaN source to the reaction chamber. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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Specification