×

Measurement apparatus, exposure apparatus, and device manufacturing method

  • US 20070097341A1
  • Filed: 06/21/2006
  • Published: 05/03/2007
  • Est. Priority Date: 06/22/2005
  • Status: Active Grant
First Claim
Patent Images

1. A measurement apparatus for measuring information on exposure light, comprising a light receiving device that is detachable from a substrate stage and receives the exposure light while being held by the substrate stage, the substrate stage holding a substrate, the substrate being irradiated with the exposure light via a liquid.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×