Integrated detecting processor

• US 20070114413A1
• Filed: 11/18/2005
• Published: 05/24/2007
• Est. Priority Date: 11/18/2005
• Status: Abandoned Application

• Current Assignee: James Parker, Randall Wang
• Original Assignee: James Parker, Randall Wang
• Inventors: Parker, James, Wang, Randall
• Application Number:
  US11/282,362
• Publication Number:
  US 20070114413A1
• Time in Patent Office: Days
• US Class Current: 250/338.300
• CPC Class Codes: G01J 5/34 using capacitors, e.g. pyroelectric capacitors
• CPC Class Codes: G08B 13/191 using pyroelectric sensor means
• CPC Class Codes: G08B 29/24 Self-calibration, e.g. compensating for environmental drift or ageing of components

Abstract

An infrared sensor includes an infrared generator for generating infrared radiation within a detecting area, a pyroelectric sensor, a microprocessor, and an integrated detecting processor. The pyroelectric sensor is electrically communicated with the infrared generator, wherein the infrared radiation as an input signal is converted into a DC signal as an output signal having a real signal with low frequency and a noise signal mixed therewith. The microprocessor includes an A/D converter electrically connected with the pyroelectric sensor, wherein the microprocessor is arranged to receive the DC signal for data processing. The integrated detecting processor, which is electrically connected with the microprocessor, is adapted for stripping out the DC signal from the pyroelectric sensor to control a DC level of the DC signal, such that the real signal is allowed to be accurately processed in the microprocessor without data overflowing.

Claims

1. An infrared sensor, comprising:

an infrared generator for generating infrared radiation within a detecting area;

a pyroelectric sensor electrically communicated with said infrared generator, wherein said infrared radiation as an input signal is converted into a DC signal as an output signal through said pyroelectric sensor, wherein said DC output signal has a real signal with low frequency and a noise signal mixed therewith;

a microprocessor which comprises a A/D converter electrically connected with said pyroelectric sensor, wherein said microprocessor is arranged to receive said DC signal for data processing so as to determine whether a target locating within said detecting area; and

an integrated detecting processor, which is electrically connected with said microprocessor, adapted for stripping out said DC signal from said pyroelectric sensor to control a DC level of said DC signal, such that said real signal is allowed to be accurately processed in said microprocessor without data overflowing.

2. The infrared sensor, as recited in claim 1, wherein said integrated detecting processor comprises a DC generator having the same DC resolution of said microprocessor.

3. The infrared sensor, as recited in claim 1, wherein said microprocessor further comprises a signal analysis unit electrically connecting with said A/D converter for statistically analyzing said DC signal, wherein said signal analysis unit statistically collects a plurality of sample data from said DC signal via a time domain to dynamically control said sample data by itself, wherein a control range of said DC signal is determined from said sample data in such a manner that when said sample data falls out of said control range, said sample data is considered as said noise signal to be discarded from said DC signal, so as to accurately process said real data with low frequency in said DC signal in said A/D converter.

4. The infrared sensor, as recited in claim 2, wherein said microprocessor further comprises a signal analysis unit electrically connecting with said A/D converter for statistically analyzing said DC signal, wherein said signal analysis unit statistically collects a plurality of sample data from said DC signal via a time domain to dynamically control said sample data by itself, wherein a control range of said DC signal is determined from said sample data in such a manner that when said sample data falls out of said control range, said sample data is considered as said noise signal to be discarded from said DC signal, so as to accurately process said real data with low frequency in said DC signal in said A/D converter.

5. The infrared sensor, as recited in claim 3, wherein said microprocessor further comprises a differential input source electrically coupling with said pyroelectric sensor to measure a difference between two signals from said DC generator and said pyroelectric sensor.

6. The infrared sensor, as recited in claim 4, wherein said microprocessor further comprises a differential input source electrically coupling with said pyroelectric sensor to measure a difference between two signals from said DC generator and said pyroelectric sensor.

7. The infrared sensor, as recited in claim 4, wherein said microprocessor further comprises a temperature sensor for determining a temperature of said target with respect to an ambient temperature so as to control a sensitivity of said microprocessor.

8. The infrared sensor, as recited in claim 6, wherein said microprocessor further comprises a temperature sensor for determining a temperature of said target with respect to an ambient temperature so as to control a sensitivity of said microprocessor.

9. The infrared sensor, as recited in claim 6, wherein said microprocessor further comprises a signal amplifier amplifying said DC signal with said real signal before sending to said A/D converter.

10. The infrared sensor, as recited in claim 8, wherein said microprocessor further comprises a signal amplifier amplifying said DC signal with said real signal before sending to said A/D converter.

11. A microprocessor for infrared sensor having a DC signal, comprising:

a A/D converter; and

a signal analysis unit electrically connecting with said A/D converter for statistically analyzing said DC signal, wherein said signal analysis unit statistically collects a plurality of sample data from said DC signal via a time domain to dynamically control said sample data by itself, wherein a control range of said DC signal is determined from said sample data in such a manner that when said sample data falls out of said control range, said sample data is considered as a noise signal to be discarded from said DC signal, so as to accurately process a real data with low frequency in said DC signal in said A/D converter.

12. The microprocessor, as recited in claim 11, wherein said signal analysis unit comprises a data processor statistically determining said control range to form an upper control limit and a lower control limit, wherein a range between said upper and lower control limits is determined in term of numbers of standard deviation from said sample data within said time domain.

13. The microprocessor, as recited in claim 12, wherein said data processor is a n-bit processor statistically takes n sample data at one time to form a single sample for data analysis, so as to increase a resolution of said A/D converter by over sampling.

14. The microprocessor, as recited in claim 13, wherein said data processor is a 16-bit processor statistically takes 16 sample data at one time.

15. The microprocessor, as recited in claim 11, further comprising a temperature sensor incorporating with said infrared sensor to control a sensitivity of said microprocessor.

16. The microprocessor, as recited in claim 14, further comprising a temperature sensor incorporating with said infrared sensor to control a sensitivity of said microprocessor.

17. A method of analyzing DC signal for A/D converter, comprising the steps of:

(a) statistically collects a plurality of sample data from said DC signal via a time domain to dynamically control said sample data by itself;

(b) determining a control range of said DC signal from said sample data

(c) discarding said sample data from said DC signal when said sample data falls out of said control range; and

(d) taking said sample data into account for processing in said A/D converter when said sample data falls within said control range.

18. The method as recited in claim 17, in step (a), further comprising a step of statistically taking a predetermined numbers of sample data at one time to form a single sample for data analysis, so as to increase a resolution of said A/D converter by over sampling.

19. The method as recited in claim 17, in step (b), further comprising a step of determining an upper control limit and a lower control limit of said control range, wherein a range between said upper and lower control limits is determined in term of numbers of standard deviation from said sample data within said time domain.

20. The method as recited in claim 18, in step (b), further comprising a step of determining an upper control limit and a lower control limit of said control range, wherein a range between said upper and lower control limits is determined in term of numbers of standard deviation from said sample data within said time domain.

21. The method as recited in claim 19, in step (b), further comprising a step of controlling a range between said upper and lower control limits to control a sensitivity of sample data collection.

22. The method as recited in claim 20, in step (b), further comprising a step of controlling a range between said upper and lower control limits to control a sensitivity of sample data collection.

23. The method, as recited in claim 17, further comprising a step of normalizing said sample data which falls within said control range for said A/D converter.

24. The method, as recited in claim 22, further comprising a step of normalizing said sample data which falls within said control range for said A/D converter.