Testing circuit for a data interface

• US 20070118322A1
• Filed: 09/11/2006
• Published: 05/24/2007
• Est. Priority Date: 10/20/2005
• Status: Active Grant

• Current Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hon Hai Precision Industry Co., Ltd.
• Inventors: Wu, Kun-Lung, Xiao, Ren-Jun, Tan, Yi-Cai
• Granted Patent: US 7,403,021 B2
• Time in Patent Office: Days
• US Class Current: 702/117
• CPC Class Codes: G01R 31/31703 Comparison aspects, e.g. signature analysis, comparators concerning scan tests G01R31/318566; concerning testers G01R31/3193
• CPC Class Codes: G01R 31/31715 Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer

Abstract

A testing circuit for an interface includes a load feeding circuit and a voltage testing circuit. The load feeding circuit includes a resistance-regulating unit, a first comparator, a pass element, and a capacitor. The resistance-regulating unit is connected to a positive input of the first comparator. A negative input of the first comparator is connected to the capacitor and a first terminal of the pass element. An output of the first comparator is connected to a second terminal of the pass element. A third terminal of the pass element is connected to the interface. The voltage testing circuit includes a second comparator and a display member connected to the second comparator. The voltage of the interface and a reference voltage are input to inputs of the second comparator, and the second comparator outputs a signal to control the display member to display a comparison result.

Claims

1. A testing circuit adapted for an interface, the testing circuit comprising:

a load feeding circuit comprising a resistance-regulating unit, a first comparator, a pass element, and a capacitor, the resistance-regulating unit connected to a positive input of the first comparator, a negative input of the first comparator connected to the capacitor and a first terminal of the pass element, an output of the first comparator connected to a second terminal of the pass element, a third terminal of the pass element connected to the interface, a load applied to the interface being regulated by changing a resistance value of the resistance-regulating unit; and

a voltage testing circuit comprising a second comparator and a display member connected to an output of the second comparator, the voltage of the interface being input to one input of the second comparator to compare with a reference voltage, the second comparator outputting a signal to control the display member to display a comparison result.

2. The testing circuit as claimed in claim 1, wherein the resistance-regulating unit comprises a plurality of switches, each switch connected with at least one resistor, and the resistance value of the resistance-regulating unit can be regulated by operating the switches.

3. The testing circuit as claimed in claim 1, wherein the pass element comprises a MOSFET transistor, a drain of the MOSFET transistor connected to the interface, a source of the MOSFET transistor connected to the negative input of the first comparator, a gate of the MOSFET connected to the output of the first comparator.

4. The testing circuit as claimed in claim 3, wherein the pass element further comprises a bipolar junction transistor (BJT), a collector of the BJT connected to the gate of the MOSFET transistor, a base of the BJT connected to the output of the first comparator.

5. The testing circuit as claimed in claim 1, wherein the display member comprises a first light emitting diode (LED), the first LED connected to the output of the second comparator, and when the second comparator outputs a high level voltage, the first LED is lit.

6. The testing circuit as claimed in claim 5, further comprising a third comparator and a second LED, wherein the other input of the second comparator is connected to one input of the third comparator, the output of the second comparator is connected to the other input of the third comparator, the third LED is connected to an output of the third comparator, and when the second comparator outputs a low level voltage, the third LED is lit.

7. A testing circuit adapted for an interface, the testing circuit comprising:

a first comparator, a negative input of the first comparator connected to the interface, a positive input of the first comparator being input a reference voltage;

a second comparator, a positive input of the second comparator being input the reference voltage, a negative input of the second comparator connected to an output of the first comparator;

a first display member connected to the output of the first comparator, the voltage of the interface being compared with the reference voltage, the first comparator outputting a signal to control the first display member to display a comparison result; and

a second display member connected to an output of the second comparator, the voltage from the output of the first comparator being compared with the reference voltage, the second comparator outputting a signal to control the second display member to display a comparison result.

8. The testing circuit as claimed in claim 7, wherein the first display member and the second display member comprise a light emitting diode (LED) respectively, and when the first comparator/the second comparator outputs a high level voltage, the corresponding LED is lit.

9. The testing circuit as claimed in claim 7, further comprising a load feeding circuit, wherein the load feeding circuit comprises a resistance-regulating unit, a third comparator, a pass element, and a capacitor, a negative input of the third comparator connected to the capacitor and a first terminal of the pass element, an output of the third comparator connected to a second terminal of the pass element, a third terminal of the pass element connected to the interface, a load applied to the interface being regulated by changing a resistance value of the resistance-regulating unit.

10. The testing circuit as claimed in claim 9, wherein the pass element comprises a MOSFET transistor, a drain of the MOSFET transistor connected to the interface, a source of the MOSFET transistor connected to the negative input of the third comparator, a gate of the MOSFET transistor connected to the output of the third comparator.

11. The testing circuit as claimed in claim 10, wherein the pass element further comprises a bipolar junction transistor (BJT), a collector of the BJT connected to the gate of the MOSFET transistor, a base of the BJT connected to the output of the third comparator.

12. A circuit for testing an interface, comprising:

a load feeding circuit electrically connectable with an interface to be tested to provide a load for said interface to function, said load feeding circuit comprising a resistance-regulating unit so as to regulate said provided load for said interface by means of varying a resistance value of said resistance-regulating unit; and

a voltage testing circuit electrically connectable with said interface to receive output of said interface, said voltage testing circuit comprising a display member and a comparator electrically connectable between said interface and said display member, said comparator receiving an output voltage from said interface and a reference voltage for comparison in order to controllably output to said display member for displaying comparison results of said output voltage and said reference voltage.

13. The circuit as claimed in claim 12, wherein said resistance-regulating unit comprises a plurality of switches, each of which is electrically connectable with at least one resistor, said resistance value of said resistance-regulating unit is able to vary by operation of said plurality of switches.