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METHOD FOR MANUFACTURING A WAFER LEVEL CHIP SCALE PACKAGE

  • US 20070132108A1
  • Filed: 02/21/2007
  • Published: 06/14/2007
  • Est. Priority Date: 10/22/2002
  • Status: Abandoned Application
First Claim
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1. A wafer level chip scale package (CSP), comprising:

  • a semiconductor chip having chip pads and a passivation layer exposing chip pads;

    a first patterned dielectric layer disposed on the passivation layer; and

    a second patterned dielectric layer, the first and second patterned dielectric layers exposing the chip pads, wherein the first and second patterned dielectric layers have an embossed portion comprising a concave portion and a convex portion, the concave portion exposing a portion of the first patterned dielectric layer where a ball pad is to be formed, the convex portion being formed of the second patterned dielectric layer.

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