Imaging system with long-standoff capability

• US 20070140423A1
• Filed: 11/13/2006
• Published: 06/21/2007
• Est. Priority Date: 11/11/2005
• Status: Active Grant

• Current Assignee: L-3 Communications Security and Detection Systems Incorporated
• Original Assignee: L-3 Communications Security and Detection Systems Incorporated
• Inventors: Foland, Andrew
• Granted Patent: US 7,809,104 B2
• Time in Patent Office: Days
• US Class Current: 378/57
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01V 5/222 measuring scattered radiation

Abstract

An imaging system that can form an image of an item under inspection using scattered radiation. A pencil beam of radiation is steered over the item under inspection and scattered radiation is detected. Regions of the item under inspection form which radiation is scattered are resolved in three dimensions using two-dimensional coordinates to which the pencil beam is steered. The third dimension is resolved using time of flight from the source. Because the inspection system can be located on one side of an item under inspection, an item may be imaged from a long distance and the imaging system may be mounted on a moving vehicle, making the imaging system well suited for use in many security inspection systems to detect explosives and other contraband items.

Claims

1. A method of imaging an item, comprising:

a) scanning x-ray beam over the item;

b) measuring the intensity and scattering time of radiation scattered from the item; and

c) forming an image of the item based at least in part on the measured intensity and scattering time.

2. The method of claim 1, wherein forming an image comprises forming a three-dimensional image.

3. The method of claim 2, wherein:

scanning comprises successively focusing a pencil beam at each of a plurality of irradiated areas; and

measuring comprises detecting radiation scattered while the pencil beam is focused at each of the plurality of irradiated areas.

4. The method of claim 3, wherein measuring scattering time comprises, for each of the plurality of irradiated areas, measuring an arrival time of the scattered radiation relative to a time at which the pencil beam is focused on the irradiated area.

5. The method of claim 4, wherein forming a three-dimensional image comprises assigning values based on an intensity of the radiation scattered from the item to a three-dimensional array of voxels, each voxel having a position in a first dimension and a second dimension based on a position in a first dimension and a second dimension of an irradiated area and a position in a third dimension proportional to an arrival time measured for the irradiated area.

6. The method of claim 1, wherein scanning an x-ray beam comprises:

steering an electron beam over a target to generate x-ray radiation; and

focusing the x-ray radiation into a pencil x-ray beam.

7. The method of claim 6, wherein steering the electron beam comprises varying the strength of a magnetic field.

8. The method of claim 1, further comprising:

d) analyzing the image to determine whether the item contains an explosive.

9. The method of claim 1, wherein the method further comprises:

d) generating radiation;

e) focusing the radiation into the x-ray beam.

10. The method of claim 9, wherein focusing the radiation comprises focusing the radiation with a refractive compound lens.

11. The method of claim 9, wherein focusing the radiation comprises focusing the radiation with a zone plate.

12. The method of claim 9, further comprising:

f) filtering the radiation.

13. The method of claim 1, further comprising:

d) generating the x-ray beam with a backscatter laser.

14. The method of claim 1, further comprising:

d) generating the x-ray beam with a synchrotron.

15. The method of claim 1, wherein scanning the beam over the item comprises moving the item relative to an x-ray source.

16. The method of claim 1, wherein the item comprises a vehicle and scanning the collimated beam comprises moving the vehicle relative to an x-ray source.

17. An inspection system, comprising:

a) a steerable source adapted to emit a collimated beam of radiation toward an illumination area, the collimated beam having a narrow beam width at a distance in excess of 50 meters;

b) a detector panel positioned to receive radiation from the direction of the illumination area; and

c) a data analysis system, adapted to form an image of an item proximate the illumination area, the image comprising a plurality of regions, each region having a value based on the magnitude of an output of the detector panel at a time relative to the time at which the collimated beam of radiation is emitted toward the illumination area.

18. The inspection system of claim 17, wherein the collimated beam has a width less than 10 mm at a distance of 70 meters.

19. The inspection system of claim 17, wherein the detector array has an area greater than 0.5 square meters.

20. The inspection system of claim 19, wherein the detector array has an area greater than 1 square meter.

21. The inspection system of claim 19, wherein the detector array comprises a plurality of avalanche photodiodes.

22. The inspection system of claim 17, wherein the x-ray source and the detector array are mounted to a vehicle.

23. The inspection system of claim 17, wherein the steerable source comprises an electron storage ring and an optical cavity, the optical cavity being positioned to overlap a portion of the electron storage ring.

24. The inspection system of claim 17, wherein the source comprises a focusing element.

25. The inspection system of claim 24, wherein the focusing element comprises a Fresnel zone plate.

26. The inspection system of claim 24, wherein the focusing element comprises a compound refractive lens.

27. The inspection system of claim 26, wherein the compound refractive lens comprises an aperture bounded by at least one serrated wall.

28. The inspection system of claim 27, wherein the at least one serrated wall is formed of beryllium or lithium.

29. The inspection system of claim 26, wherein the compound refractive lens comprises a member having a plurality of holes therein, the holes forming an x-ray path.