×

Method and apparatus for product defect classification

  • US 20070150084A1
  • Filed: 12/22/2005
  • Published: 06/28/2007
  • Est. Priority Date: 09/07/2005
  • Status: Active Grant
First Claim
Patent Images

1. A method of processing defect data indicative of defects in a product, comprising:

  • assigning each of the defects one of a plurality of severity levels;

    assigning each of the defects one of a plurality of impact levels;

    classifying the defects into categories based on combinations of severity level and impact level;

    automatically generating a graphic representative of a topographical relation among numbers of defects in the categories; and

    displaying the graphic on a graphical user interface (GUI).

View all claims
  • 4 Assignments
Timeline View
Assignment View
    ×
    ×