NON-DESTRUCTIVE STRINGER INSPECTION APPARATUS AND METHOD

• US 20070151375A1
• Filed: 03/21/2007
• Published: 07/05/2007
• Est. Priority Date: 01/24/2005
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Fogarty, Michael, Georgeson, Gary, Kennedy, James, Freet, Martin, Sarr, Dennis, VonWahlde, Ronald, Chapman, Michael
• Granted Patent: US 7,263,889 B2
• Time in Patent Office: Days
• US Class Current: 73/866.500
• CPC Class Codes: G01N 2291/0231 Composite or layered materials
• CPC Class Codes: G01N 2291/0258 Structural degradation, e.g. fatigue of composites, ageing of oils
• CPC Class Codes: G01N 2291/0422 Shear waves, transverse waves, horizontally polarised waves
• CPC Class Codes: G01N 2291/105 two or more emitters, two or more receivers
• CPC Class Codes: G01N 2291/2694 Wings or other aircraft parts
• CPC Class Codes: G01N 29/225 Supports, positioning or alignment in moving situation
• CPC Class Codes: G01N 29/265 by moving the sensor relative to a stationary material

Abstract

A hat stringer inspection device permits continuous inspection of hat stringers as one or more probes are moved along the length of the hat stringer. Probes may be magnetically coupled to opposing surfaces of the structure, including, for example, where one of the probes is positioned inside the hat stringer and the probes are magnetically coupled across the surface of the hat stringer. The device may be autonomous with a feedback-controlled motor to drive the inspection device along the hat stringer. Magnetic coupling is also used to re-orient the position and/or alignment of the probes with respect to changes in the hat stringer or shapes, sizes, and configurations of hat stingers.

Claims

1. A probe for inspecting a structure comprising:

a housing configured for traveling over a first surface of the structure under inspection, and wherein the housing is further configured to span a cross-section of a portion of the structure that protrudes from the first surface of the structure wherein the portion of the structure that protrudes from the first surface of the structure forms a hat stringer, and wherein the housing is further configured to span a cross-section of the hat stringer; and

at least one inspection sensor carried by the housing for inspecting the structure as the probe is moved over the first surface of the structure.

2. The probe of claim 1, wherein the hat stringer comprises a top surface and two sides with a first corner and a second corner, respectively, between the top surface and the two sides, and wherein the probe comprises at least one inspection sensor oriented to inspect the first corner of the hat stringer.

3. The probe of claim 2, wherein the probe further comprises at least one inspection sensor oriented to inspect the second corner of the hat stringer adjacent to the first corner.

4. The probe of claim 3, wherein the hat stringer comprises a first edge and a second edge, respectively between the two sides and the first surface, wherein the first edge is adjacent the first corner and the second edge is adjacent the second corner, and wherein the probe further comprises at least one inspection sensor oriented to inspect the first edge.

5. The probe of claim 4, wherein the probe further comprises at least one inspection sensor oriented to inspect the second edge.

6. The probe of claim 1, wherein the at least one inspection sensor of the probe comprises an array of inspection sensors.

7. The probe of claim 6, wherein the probe further comprise at least one transducer holder connected to the housing and for supporting and orienting the array of inspection sensors.

8. The probe of claim 7, wherein at least one transducer holder is adjustably connected to the housing with spring-biased positional adjustment.

9. The probe of claim 1, wherein the probe is separated into a first side and a second side, and wherein each of the first side of the probe and the second side of the probe comprise at least one inspection sensor.

10. The probe of claim 9, wherein each of the first and second sides of the probe comprises at least one magnetic coupling device positioned to be magnetically coupled with a corresponding magnetic coupling device of the second side and the first side, respectively, thereby holding the first and second sides against the first surface of the structure.

11. The probe of claim 1, wherein the probe further comprises a motor connected to the housing and for moving the probe over the first surface of the structure.

12. The probe of claim 1, wherein the probe further comprises at least one magnetic coupling device carried by the housing.

13. The probe of claim 1, wherein the probe further comprises at least one contact member for supporting the probe on the structure as the probe is moved over the first surface of the structure.

14. The probe of claim 13, wherein the hat stringer comprises a top surface and two sides, and wherein the probe comprises at least one contact member oriented to support the probe on one of the sides of the hat stringer as the probe is moved over the first surface of the structure.

15. The probe of claim 13, wherein the contact members are selected from the group consisting a wheel, a ball bearing, a fluid bearing, a skid, and a tread.

16. The probe of claim 1, wherein the probe is separated into a first side and a second side, and wherein each of the first and second sides comprises at least one contact member for supporting the respective first and second sides of the probe on the structure as the probe is moved over the first surface of the structure.

17. The probe of claim 1, wherein the hat stringer comprises a top surface and two sides with a first corner and a second corner, respectively, between the top surface and the two sides, and wherein at least the first corner is adjustable to provide a rotatable connection between the first side and the top surface of the hat stringer.

18. The probe of claim 17, wherein the first corner comprises at least one hinge.

19. The probe of claim 1, further comprising a linear encoder coupled to the housing and adapted to detect linear movement of the probe as the probe is moved over the first surface of the structure.

20. A probe for inspecting a structure comprising:

a housing configured for traveling over a first surface of the structure under inspection, and wherein the housing is further configured to span a cross-section of a portion of the structure that protrudes from the first surface of the structure wherein the portion of the structure that protrudes from the first surface of the structure forms a shape selected from the group of;

a trapezoid, a rectangular box, and a triangle, and wherein the housing is further configured to span a cross-section of the shape; and

at least one inspection sensor carried by the housing for inspecting the structure as the probe is moved over the first surface of the structure.